Dr. Francois Houbre
Process & Instrumentation Manager at Safran Electronics & Defense
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 19 November 2003 Paper
Jean-Christophe Poncetta, Vincent Beau, Genevieve Chabassier, Jacques Rodolfo, Remi Bourgois, C. Hurst, Francois Houbre
Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.530105
KEYWORDS: Lenses, Mirrors, Optical filters, Interferometry, Spherical lenses, Lithium, Laser metrology, Spatial filters, Interferometers, Metrology

Proceedings Article | 9 April 2002 Paper
B. Pinot, Herve Leplan, Francois Houbre, Eric Lavastre, Jean-Christophe Poncetta, Genevieve Chabassier
Proceedings Volume 4679, (2002) https://doi.org/10.1117/12.461687
KEYWORDS: Mirrors, Laser damage threshold, Laser induced damage, Hafnium, Optical coatings, Wavefronts, Photometry, Reflectivity, Interferometers, Metals

Proceedings Article | 27 December 2001 Paper
Proceedings Volume 4451, (2001) https://doi.org/10.1117/12.453608
KEYWORDS: Mirrors, Aspheric lenses, Lenses, Surface finishing, High power lasers, Polishing, Spatial filters, Aspheric optics, Off axis mirrors, Wavefronts

Proceedings Article | 6 September 1999 Paper
Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360188
KEYWORDS: Polishing, Lenses, Spatial filters, Optical amplifiers, Laser amplifiers, Optical fabrication, Laser optics, Optical testing, Surface finishing, Polishing equipment

Proceedings Article | 6 September 1999 Paper
Luc Thepaut, Jacques Rodolfo, Francois Houbre, Renaud Mercier-Ythier
Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360176
KEYWORDS: Optical fabrication, Distortion, Modulation transfer functions, Glasses, Surface finishing, Polishing, Optics manufacturing, Image quality, Image processing, Optical testing

Showing 5 of 6 publications
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