Mr. Fred C. M. Couweleers Profile

Fred C. M. Couweleers

at MAPPER Lithography

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 26 March 2013 Paper

MAPPER alignment sensor evaluation on process wafers

N. Vergeer, L. Lattard, G. de Boer, F. Couweleers, D. Dave, J. Pradelles, J. Bustos

Proceedings Volume 8680, 86801E (2013) https://doi.org/10.1117/12.2011402

KEYWORDS: Optical alignment, Semiconducting wafers, Sensors, Reflectivity, Reflection, System on a chip, Lithography, Wafer-level optics, Silicon, Maskless lithography

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Proceedings Article | 30 May 2003 Paper

In-line geometric fault detection in car parts based on structured light projection and image processing

Fred Couweleers, Oystein Skotheim, Helene Schulerud, Kristin Kaspersen

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.500056

KEYWORDS: Cameras, Projection systems, Image processing, Inspection, Calibration, Fringe analysis, Time metrology, Phase measurement, Imaging systems, Structured light

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Proceedings Article | 6 September 1999 Paper

Minideflectometer for measuring optical finish quality

Willem van Amstel, Stefan Baumer, Fred Couweleers

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360167

KEYWORDS: Polishing, Surface finishing, Head, Mirrors, Magnetism, Spatial frequencies, Deflectometry, Optics manufacturing, Scattering, Multi-element lenses

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