Prof. Frédéric Morain-Nicolier Profile

Prof. Frédéric Morain-Nicolier

at Institut Univ de Technologie

SPIE Involvement:

Author

SPIE Journal Paper | 2 January 2017 Open Access

Special Section Guest Editorial:Perceptually Driven Visual Information Analysis

Mohamed-Chaker Larabi, Sanghoon Lee, Mohammed El Hassouni, Frédéric Morain-Nicolier, Rachid Jennane

JEI, Vol. 25, Issue 06, 061601, (January 2017) https://doi.org/10.1117/12.10.1117/1.JEI.25.6.061601

KEYWORDS: Visualization, Information visualization, Visual analytics, Visual process modeling, Image quality, Image segmentation, Image processing, 3D modeling, Video, Detection and tracking algorithms

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Proceedings Article | 24 February 2005 Paper

Low-cost system for ancient stamps range image acquisition

Edouard Thomas, David Fofi, Frederic Nicolier, Gilles Millon, Ralph Seulin

Proceedings Volume 5679, (2005) https://doi.org/10.1117/12.588901

KEYWORDS: Calibration, Cameras, Projection systems, Scanners, Image processing, Image segmentation, 3D image processing, Image analysis, 3D scanning, Image acquisition

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Proceedings Article | 1 November 2004 Paper

A wavelet filter performance criterion

Frederic Nicolier, Frederic Truchetet

Proceedings Volume 5607, (2004) https://doi.org/10.1117/12.581231

KEYWORDS: Wavelets, Denoising, Image compression, Fast wavelet transforms, Image processing, Chemical species, Image filtering, Wavelet transforms, Signal processing, Image quality

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Proceedings Article | 27 February 2004 Paper

Rational wavelet transform: application to signal denoising

Alexandre Baussard, Olivier Laligant, Frederic Nicolier, Frederic Truchetet

Proceedings Volume 5266, (2004) https://doi.org/10.1117/12.516068

KEYWORDS: Wavelets, Denoising, Wavelet transforms, Signal processing, Signal to noise ratio, Filtering (signal processing), Algorithms, Signal analyzers, Electronic filtering, Projection systems

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Proceedings Article | 1 May 2003 Paper

Range image binarization: applications to wooden stamp analysis

Ralph Seulin, O. Morel, Gilles Millon, Frederic Nicolier

Proceedings Volume 5132, (2003) https://doi.org/10.1117/12.515045

KEYWORDS: Image processing, 3D acquisition, Image acquisition, 3D scanning, Printing, 3D image processing, Binary data, Laser scanners, Image analysis, Image quality

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SPIE Journal Paper | 1 July 2002

Discrete wavelet transform implementation in Fourier domain for multidimensional signal

Frederic Nicolier, Olivier Laligant, Frederic Truchetet

JEI, Vol. 11, Issue 03, (July 2002) https://doi.org/10.1117/12.10.1117/1.1479701

KEYWORDS: Electronic filtering, Filtering (signal processing), Convolution, Multidimensional signal processing, Signal processing, Wavelet transforms, Fourier transforms, Image segmentation, Wavelets, Optical filters

Proceedings Article | 8 March 2002 Paper

Assessment of mesh simplification algorithm quality

Michael Roy, Frederic Nicolier, S. Foufou, Frederic Truchetet, Andreas Koschan, Mongi Abidi

Proceedings Volume 4661, (2002) https://doi.org/10.1117/12.460166

KEYWORDS: Visualization, Quality measurement, Software development, 3D modeling, Solid modeling, Reverse modeling, Statistical modeling, Image segmentation, Distance measurement, Distortion

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SPIE Journal Paper | 1 January 2001

Subpixel edge detection for dimensional control by artificial vision

Frederic Truchetet, Frederic Nicolier, Olivier Laligant

JEI, Vol. 10, Issue 01, (January 2001) https://doi.org/10.1117/12.10.1117/1.1316089

KEYWORDS: Edge detection, Signal to noise ratio, Detection and tracking algorithms, Signal processing, Machine vision, Pixel resolution, Image processing, Digital filtering, Sensors, Linear filtering

Proceedings Article | 4 December 2000 Paper

Multiresolution analysis with decimated wavelet transform for image zooming

Frederic Nicolier, Frederic Truchetet

Proceedings Volume 4119, (2000) https://doi.org/10.1117/12.408667

KEYWORDS: Reconstruction algorithms, Wavelets, Wavelet transforms, Databases, Fast wavelet transforms, Image processing, Image resolution, Image quality, Signal processing, Resolution enhancement technologies

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Proceedings Article | 19 April 2000 Paper

Multiscale scheme for image magnification

Frederic Nicolier, Olivier Laligant, Frederic Truchetet

Proceedings Volume 3974, (2000) https://doi.org/10.1117/12.382986

KEYWORDS: Wavelets, Reconstruction algorithms, Databases, Wavelet transforms, Image quality, Detection and tracking algorithms, Fast wavelet transforms, Image processing, Saturn, Image resolution

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Proceedings Article | 19 May 1999 Paper

Human cell texture analysis with quincunx spline wavelet transform

Frederic Nicolier, Olivier Laligant, Frederic Truchetet, Anne-Claire Legrand, Sophie Kohler

Proceedings Volume 3644, (1999) https://doi.org/10.1117/12.348481

KEYWORDS: Digital filtering, Wavelets, Wavelet transforms, Image processing, Image analysis, Ions, Image classification, Statistical analysis, Image filtering, Distance measurement

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Proceedings Article | 6 October 1998 Paper

B-spline quincunx wavelet transform and implementation in Fourier domain

Frederic Nicolier, Olivier Laligant, Frederic Truchetet

Proceedings Volume 3522, (1998) https://doi.org/10.1117/12.325767

KEYWORDS: Digital filtering, Wavelets, Linear filtering, Wavelet transforms, Analytical research, Image processing, Signal processing, Image filtering, Electronic filtering, Convolution

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Proceedings Article | 6 October 1998 Paper

Restoration of blurred images by edge detection

Alain Dupasquier, Frederic Nicolier, Gaetan Delcroix, Frederic Truchetet, Olivier Laligant

Proceedings Volume 3522, (1998) https://doi.org/10.1117/12.325766

KEYWORDS: Edge detection, Deconvolution, Image processing, Wavelets, Detection and tracking algorithms, Image processing algorithms and systems, Human vision and color perception, Zoom lenses, Image segmentation, Binary data

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Showing 5 of 13 publications

Conference Committee Involvement (3)

Wavelet Applications in Industrial Processing III

24 October 2005 | Boston, MA, United States

Wavelet Applications in Industrial Processing II

27 October 2004 | Philadelphia, Pennsylvania, United States

Wavelet Applications in Industrial Processing

28 October 2003 | Providence, RI, United States

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