Dr. Gim S. Chen
Sr. Process Engineer at AKrion LLC
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 December 2003 Paper
Gim Chen, Julio Reyes, James Wood, Ismail Kashkoush, Laurent Dieu, Richard Novak
Proceedings Volume 5256, (2003) https://doi.org/10.1117/12.518247
KEYWORDS: Photomasks, Transmittance, Reticles, Chemistry, Photoresist processing, Binary data, Mask cleaning, Reflectivity, Photoresist materials, Particles

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top