A spatial phase unwrapping algorithm based on multi-anchors bidirectional location and suppression (SPUA-MBLS) is proposed. Spatial phase unwrapping algorithms (SPUAs) can play an important role in three-dimensional (3-D) measurement due to their phase unwrapping without any additional auxiliary pattern. SPUAs based on line scanning can achieve much faster phase unwrapping line-by-line than the traditional SPUA based on reliability sort, such as the quality-guided SPUA. But they are prone to suffer from residual error propagation caused by noise. The proposed algorithm first binarizes the wrapped phase to generate a crude fringe order map with multi-anchors and then cross-validates this map forward-backward to locate and suppress those multi-anchors as much as possible. Thus, a more perfect fringe order map can be segmented to achieve spatial phase unwrapping with a more effective improvement of residual error propagation. The experimental results show the feasibility and validity of the proposed algorithm. The proposed algorithm is proved to have higher measurement accuracy, and it has also shown higher robustness in anti-noise performance while inheriting the high-speed phase unwrapping feature.
Compensation of phase errors has emerged as a paramount task in fringe projection profilometry. In this paper, an erosion-clustering connected domain segmentation algorithm is proposed to compensate for the phase errors of traditional temporal phase unwrapping (TPU). At the onset, two connected domain maps from the wrapped phase are generated with a threshold value of zero. Then the connected domain adhering parts due to noise and height abruptness are forcibly disconnected by an erosion algorithm. Finally, the separated valid points are clustered based on the minimum Eulerian distance method. The combination of several techniques enables the reconstruction of high-quality 3D geometry and endows our method with the flexibility to redress errors arising from the traditional TPU method. Experimental results demonstrate the effectiveness and versatility of the proposed method, building upon the existing TPU methods that obtain fringe orders.
Recently, a single-shot N-step phase measuring profilometry was proposed by our research group. It not only maintains the single-shot real-time measuring characteristics but also makes its measuring accuracy selectable as appropriate N. But when the spectral aliasing in the captured deformed pattern is severe, the alternative current (AC) component may be extracted imprecisely or even failed. So, a double-shot N-step phase measuring profilometry (double-shot N-PMP) is proposed. While two complementary sinusoidal gratings are projected onto the measured object, the AC component of the captured deformed patterns can be extracted precisely even if spectrum aliasing is very serious. If the AC component multiplies with N frames of the AC components of the N-step phase-shifting fringe patterns captured from the reference plane in advance, a new N-step phase-shifting algorithm for the phase difference between the measured object and the reference plane is accomplished to reconstruct the measured object. The experimental results show the possibility and effectiveness of the proposed method. It can either improve the measuring accuracy or expand application scope. Though the double-frame gratings are needed, the real-time measuring characteristics can still maintain with the time-division multiplexing method.
A single-shot N-step phase measurement profilometry (single-shot N-PMP) is proposed. In the traditional N-step PMP, N (N > 2) frames of phase-shifting sinusoidal gratings are needed to be projected onto the measured object. The corresponding N frames of phase-shifting deformed patterns modulated by the object are needed to be captured. And the larger the N is, the higher the measuring accuracy will be. In the proposed method, only one sinusoidal grating is needed to be projected and only one corresponding deformed pattern is captured. The proposed method can efficiently avoid direct filtering in the spectrum of the deformed pattern because of the secondary modulation in computer. The proposed method is an innovative single-shot, three-dimensional (3D) measurement with the highest accuracy among the single-shot 3D measurements so far for inheriting of the traditional optional N-step PMP. And the optional larger N can result in higher accuracy while the single-shot feature can be always guaranteed both the static and real-time 3D measurements. Furthermore, the mathematical model of the proposed method is more concise compared with the traditional PMP for the phase just modulated by the measured object itself can be directly solved without two phase resolutions and two phase unwrappings for both the reference plane and the measured object. The simulations and experimental results show the feasibility and validity of the proposed method.
A curtain-type phase unwrapping algorithm is proposed. First, the 2 × 2 closed curve method is used to find out the residual point of the wrapped phase to form the residual template, and the Otsu threshold method is used to binary the modulation of the deformed pattern to form the shadow template. Second, the effective phases of up-down symmetrical points about the starting point are simultaneously unwrapped in turn until all the points in the column are completed. Third, the starting point is taken as the center of left-right symmetry, the effective phases of the nearest symmetric points are simultaneously unwrapped, and the corresponding columns are unwrapped in the same way as above. Fourth, in this way, the effective phases in the corresponding symmetric columns are successively unwrapped in the form of curtain opening until the whole phases are completely unwrapped. In the previous procedure, the shadow template and residual template guide the curtain-type phase unwrapping to avoid error diffusion. Finally, the 8-neighborhood mean algorithm and the cubic b-spline algorithm are employed to unwrap the phase values of residual points and shadow areas, respectively. The proposed method realizes the whole phase unwrapping without phase error diffusion. Experimental results show that the efficiency of the proposed method is 26% higher than that of the diamond algorithm, and its accuracy is significantly improved.
Online three-dimensional (3D) measurement plays an important role in industry. When phase-shifting profilometry is employed in online 3D measurement, pixel matching is an important step to keep objects at the same coordinate value. However, the correlation operation and marker feature matching algorithms may take a long time, increasing the complexity. So a fast and robust online 3D measurement based on feature correspondence is proposed. In this method, only one frame of the sinusoidal fringe pattern is projected onto the measured object, and image correction technique is employed to rectify pixel size. Then five frames of deformed patterns with equivalent displacement are captured by the camera, and the corresponding modulation patterns are extracted. The oriented fast and rotated brief feature algorithm is used to extract the matching pair of feature points, and the improved grid-based motion statistical feature algorithm can better eliminate the false match to achieve pixel matching. In this way, five frames of deformed patterns with an equivalent shifted-phase can be extracted. Finally, the 3D shape of the measured object is reconstructed by the five-step equivalent phase-shifting algorithm. Experimental results verify the effectiveness and feasibility of the proposed method.
By constructing two phase-shifted fringe images and a flat image, the 2 + 1 phase-shifting algorithm can reduce the error caused by motion and realize real-time and high-resolution three-dimensional (3-D) measurement. However, the nonlinear gamma of the digital light processing and the ambient light will affect the light-field distribution of the flat image, and extensive experiments have shown that the distribution of the captured flat image is inconsistent with the DC component of the deformed patterns. Therefore, based on the linear calibration model, a more realistic DC component of the deformed patterns is deduced from the captured flat image. The AC components of the deformed patterns can be extracted more genuinely by subtracting the deduced DC component from deformed patterns. So, the influence of ambient light can be suppressed efficiently to improve 3-D measuring accuracy. The experimental results show the feasibility and validity of the proposed method.
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