Dr. Jian Xu Profile

Dr. Jian Xu

Research Scientist at Singapore Institute of Manufacturing Technology

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Author

Publications (4)

Proceedings Article | 15 April 2010 Paper

X-ray CT image segmentation: automatic sandwich structure layer separation using reduced dimension Hough transformation

J. Xu, T. Liu, R. Kakarala, X. Yin

Proceedings Volume 7522, 75223U (2010) https://doi.org/10.1117/12.851419

KEYWORDS: Hough transforms, 3D image processing, Image segmentation, Edge detection, X-rays, 3D modeling, X-ray computed tomography, Composites, Sensors, X-ray imaging

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Proceedings Article | 14 February 2005 Paper

COD measurement based on the integrated liquid drop sensor

Zurong Qiu, Guoxiong Zhang, Qing Song, Jian Xu

Proceedings Volume 5634, (2005) https://doi.org/10.1117/12.572651

KEYWORDS: Liquids, Sensors, Capacitors, Databases, Head, Oxygen, Fiber optics sensors, Pollution, Chemical analysis, Data processing

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Proceedings Article | 30 September 2003 Paper

Liquid drop analysis using photonic sensors

Jian Xu, Z. Qiu, Z. Fang, Qing Sung, Ivan Reading, Xiang Li

Proceedings Volume 5264, (2003) https://doi.org/10.1117/12.509222

KEYWORDS: Liquids, Sensors, Fiber optics sensors, Capacitors, Chemical analysis, Refractive index, Head, Water, Calibration, Dielectrics

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Proceedings Article | 16 June 1997 Paper

Digital fluoroscopy using the optically coupled CCD: preliminary investigations

Hong Liu, Jian Xu, Gary Halama, James McAdoo

Proceedings Volume 2976, (1997) https://doi.org/10.1117/12.275534

KEYWORDS: Charge-coupled devices, Fluoroscopy, Contrast sensitivity, Imaging systems, X-rays, Cameras, X-ray imaging, Image intensifiers, CCD cameras, Spatial resolution

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Conference Committee Involvement (4)

Optical Metrology and Inspection for Industrial Applications II

5 November 2012 | Beijing, China

Optical Metrology and Inspection for Industrial Applications

18 October 2010 | Beijing, China

Optical Inspection and Metrology for Non-Optics Industries

3 August 2009 | San Diego, California, United States

Optomechatronic Sensors, Actuators, and Control

25 October 2004 | Philadelphia, Pennsylvania, United States

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