Ms. Jiayu Guo Profile

Jiayu Guo

at Xi'an Jiaotong Univ.

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 6 September 2017 Paper

A multi-resolution texture fusion algorithm

Yu Qin Li, Xiang Zhou, Jia Yu Guo, Tao Yang, Zi Xuan Fei

Proceedings Volume 10410, 1041015 (2017) https://doi.org/10.1117/12.2276853

KEYWORDS: 3D image processing, Volume rendering, Light sources, Cameras, Reconstruction algorithms, Digital image processing, Image fusion, Image resolution, Light sources and illumination

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Proceedings Article | 6 September 2017 Paper

An edge sensitive 3D measurement using two directional laser stripes scanning with a laser projector

Dong Li, Xiang Zhou, Changda Xu, Chao Wang, Jiayu Guo

Proceedings Volume 10410, 1041010 (2017) https://doi.org/10.1117/12.2276848

KEYWORDS: Cameras, Microelectromechanical systems, 3D modeling, Laser scanners, 3D scanning, Imaging systems, Calibration, 3D metrology, Clouds

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Proceedings Article | 26 June 2017 Paper

A hybrid structured-light measurement using a laser projector

Jiayu Guo, Xiang Zhou, Dong Li, Chao Wang, Zixuan Fei, Huanhuan Li

Proceedings Volume 10329, 103294X (2017) https://doi.org/10.1117/12.2278911

KEYWORDS: Projection systems, Cameras, Fringe analysis, Microelectromechanical systems, Laser scanners, 3D scanning, Visual process modeling, Metals, Reflectivity, 3D metrology

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Proceedings Article | 26 June 2017 Paper

A high-performance fringe pattern generation method for fringe projection profilometry

Tao Yang, Huan Huan Li, Xiang Zhou, Yu Qin Li, Jia Yu Guo, Xiao Fei Gao

Proceedings Volume 10329, 103294V (2017) https://doi.org/10.1117/12.2278902

KEYWORDS: Fringe analysis, Microelectromechanical systems, Digital Light Processing, Scanners, Point spread functions, Optical transfer functions, 3D metrology, Liquid crystal on silicon

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Proceedings Article | 21 August 2013 Paper

Characterization of single photon avalanche diodes fabricated by 0.13um CMOS technology

Jiayu Guo, Chuyu Chen, Liang Feng, Xiaofeng Pu, Xiaoli Ji, Feng Yan

Proceedings Volume 8908, 890824 (2013) https://doi.org/10.1117/12.2034784

KEYWORDS: Single photon, CMOS technology, Photodetectors, Avalanche photodiodes, Doping, Structural design, Temperature metrology, Optical power meters, Sensors, Quenching (fluorescence)

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