Jin Yu
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 October 2020 Presentation
Proceedings Volume 11551, 115510K (2020) https://doi.org/10.1117/12.2572961
KEYWORDS: 3D metrology, Imaging systems, 3D acquisition, Infrared imaging, Light, Complex systems, Reflectivity, Deflectometry, Data processing, Data integration

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