KEYWORDS: 3D metrology, Imaging systems, 3D acquisition, Infrared imaging, Light, Complex systems, Reflectivity, Deflectometry, Data processing, Data integration
Phase sensitivity plays a vital role in accurately retrieving three-dimensional (3D) shape of diffused objects in fringe projection profilometry (FPP). With regard to traditional means that simply project horizontal or vertical fringe patterns, the fringe frequency and direction are not the best choice to acquire optimal sensitivity to depth variations. This talk will present a novel method to obtain 3D shape with high accuracy by combining the optimal fringe frequency and the optimal fringe direction (OFF + OFD). The simulated and actual experiments have been carried out to demonstrate that the proposed optimization method is feasible and effective in increasing phase sensitivity and measurement accuracy.
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