Dr. Jing-Wein Wang Profile

Dr. Jing-Wein Wang

Dean of College

SPIE Involvement:

Author

Publications (8)

Proceedings Article | 17 September 2018 Paper

Face recognition by using wavelet-subband booster

J. W. Wang, T. H. Chen

Proceedings Volume 10752, 107521Y (2018) https://doi.org/10.1117/12.2319183

KEYWORDS: Facial recognition systems, Matrices, Image enhancement, Databases, RGB color model, Light sources and illumination, Wavelets, High dynamic range imaging, Statistical analysis, Principal component analysis

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SPIE Journal Paper | 3 December 2014

Recognition based on two separated singular value decomposition-enriched faces

Jing-Wein Wang, Ngoc Tuyen Le, Jiann-Shu Lee, Chou-Chen Wang

JEI, Vol. 23, Issue 06, 063010, (December 2014) https://doi.org/10.1117/12.10.1117/1.JEI.23.6.063010

KEYWORDS: Facial recognition systems, Databases, Light sources and illumination, Image processing, RGB color model, Skin, Feature extraction, Principal component analysis, Detection and tracking algorithms, Matrices

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SPIE Journal Paper | 1 April 2010

Contrast enhancement of x-ray image based on singular value selection

Wei-Chun Lin, Jing-Wein Wang, Shu-Yuan Lin

OE, Vol. 49, Issue 04, 047005, (April 2010) https://doi.org/10.1117/12.10.1117/1.3378111

KEYWORDS: Image enhancement, X-rays, X-ray imaging, Image processing, Image contrast enhancement, Medical imaging, Image quality, Optical engineering, Image segmentation, Principal component analysis

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SPIE Journal Paper | 1 November 2009

Electronic whiteboard construction using whiteboard and image-locating techniques

Wen-Yuan Chen, Jing-Wein Wang, Chin-Ho Chung

OE, Vol. 48, Issue 11, 117202, (November 2009) https://doi.org/10.1117/12.10.1117/1.3258345

KEYWORDS: Cameras, Optical engineering, Calibration, Databases, Signal detection, Binary data, Image resolution, Multimedia, Telecommunications, Machine vision

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SPIE Journal Paper | 1 November 2009

Three-step approach for wafer sawing lane inspection

Jing-Wein Wang, Chia-Nan Wang, Wen-Yuan Chen

OE, Vol. 48, Issue 11, 117204, (November 2009) https://doi.org/10.1117/12.10.1117/1.3265714

KEYWORDS: Inspection, Semiconducting wafers, Wafer inspection, Image segmentation, Optical engineering, Manufacturing, Neural networks, Detection and tracking algorithms, Sensors, Chromium

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SPIE Journal Paper | 1 May 2009

Nested image steganography scheme using QR-barcode technique

Wen-Yuan Chen, Jing-Wein Wang

OE, Vol. 48, Issue 05, 057004, (May 2009) https://doi.org/10.1117/12.10.1117/1.3126646

KEYWORDS: Steganography, Image quality, Feature extraction, X-ray imaging, X-rays, Digital filtering, Image filtering, Image compression, Error analysis, Image processing

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SPIE Journal Paper | 1 April 2009

Framework combined face segmentation with recognition

Jing-Wein Wang

OE, Vol. 48, Issue 04, 047206, (April 2009) https://doi.org/10.1117/12.10.1117/1.3122931

KEYWORDS: Facial recognition systems, Image segmentation, Databases, Mouth, Detection and tracking algorithms, Principal component analysis, Optical engineering, Wavelets, Skin, Eye

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SPIE Journal Paper | 1 May 2006

Eye detection based on head contour geometry and wavelet subband projection

Jing-Weing Wang, Wen-Yuan Chen

OE, Vol. 45, Issue 05, 057001, (May 2006) https://doi.org/10.1117/12.10.1117/1.2205225

KEYWORDS: Eye, Head, Wavelets, Sensors, Mouth, Optical engineering, Light sources and illumination, Facial recognition systems, Image segmentation, Image processing

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Showing 5 of 8 publications

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