Dr. Jurriaan M. Zwier Profile

Dr. Jurriaan M. Zwier

at Univ van Amsterdam

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Publications (2)

Proceedings Article | 14 February 2007 Paper

Absolute and relative quantification and calibration for sectioning fluorescence microscopy using standardized uniform fluorescent layers and SIPchart-based correction procedures

J. Zwier, L. Oomen, L. Brocks, K. Jalink, G. Brakenhoff

Proceedings Volume 6443, 64430C (2007) https://doi.org/10.1117/12.706482

KEYWORDS: Luminescence, Calibration, Point spread functions, Microscopes, Microscopy, Imaging systems, Confocal microscopy, 3D image processing, Particles, 3D imaging standards

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Proceedings Article | 12 February 2007 Paper

SIPcharts using uniform ultra-thin and thin layers for Z-response measurements in two-photon excitation fluorescence microscopy

G. Vicidomini, J. Zwier, P. Bianchini, F. Cella, E. Ronzitti, S. Krol, T. Szellas, G. F. Brakenhoff, A. Diaspro

Proceedings Volume 6442, 644224 (2007) https://doi.org/10.1117/12.714250

KEYWORDS: Microscopes, Confocal microscopy, Luminescence, Imaging systems, Point spread functions, Microscopy, Polymers, Signal detection, Microsystems, Glasses

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