Dr. Krishan Pal Chaudhary
at National Physical Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 August 2005 Paper
K. Chaudhary, R. Singhal, Shashi Singh, Chandera Shakher
Proceedings Volume 5879, 587914 (2005) https://doi.org/10.1117/12.620277
KEYWORDS: Surface roughness, 3D metrology, 3D image processing, CCD cameras, Image processing, Optical testing, Imaging systems, Surface finishing, Image acquisition, Cameras

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top