Mark H. Bergen
Masters Student
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 16 February 2018 Presentation + Paper
Timothy Westgate, Adrian Boivin, Jonathan Holzman, Blake W. Veerman, Mark Bergen, Xian Jin, Brandon Born, Mike Bernier
Proceedings Volume 10527, 105270I (2018) https://doi.org/10.1117/12.2290569
KEYWORDS: Solar cells, Silicon, Reflection, Solar energy, Silicon solar cells, Antireflective coatings, Photovoltaics, Sun, Reflectivity, Geometrical optics

Proceedings Article | 16 March 2016 Paper
Mark Bergen, Daniel Guerrero, Xian Jin, Blago Hristovski, Hugo Chaves, Richard Klukas, Jonathan Holzman
Proceedings Volume 9754, 97540A (2016) https://doi.org/10.1117/12.2208722
KEYWORDS: Receivers, Imaging systems, Geometrical optics, Transmitters, Photonic devices, Microlens, Optical navigation, Image sensors, Error analysis, Modulation, Integrated optics, Radio optics, Global Positioning System, Received signal strength, Light emitting diodes

Proceedings Article | 25 February 2016 Paper
Proceedings Volume 9747, 97470M (2016) https://doi.org/10.1117/12.2208548
KEYWORDS: Semiconductors, Terahertz radiation, Antennas, Picosecond phenomena, Electro optics, Millimeter wave sensors, Indium, Semiconductor materials, Image analysis, Scanning electron microscopy, Ultrafast phenomena, Surface finishing, Laser beam diagnostics, Polishing

Proceedings Article | 8 May 2014 Paper
Mark Bergen, Jacqueline Nichols, Christopher Collier, Xian Jin, Jonathan Holzman
Proceedings Volume 9129, 912914 (2014) https://doi.org/10.1117/12.2052523
KEYWORDS: Retroreflectors, Optical spheres, Imaging systems, Microorganisms, Collimation, Refractive index, Biosensing, Spherical lenses, Image sensors, Glasses

Proceedings Article | 24 September 2013 Paper
Christopher Collier, Brandon Born, Xian Jin, Timothy Westgate, Max Bethune-Waddell, Mark Bergen, Jonathan Holzman
Proceedings Volume 8846, 884616 (2013) https://doi.org/10.1117/12.2023764
KEYWORDS: Terahertz radiation, Gallium arsenide, Electrons, Picosecond phenomena, Scattering, Plasma, Semiconductors, Ultrafast phenomena, Surface finishing, Near field

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