Mr. Mathias Ziegler Profile

Mathias Ziegler

at Max-Born-Institut für NOK

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 26 February 2010 Paper

Simulation of facet heating in high-power red lasers

J. M. Tijero, H. Odriozola, I. Esquivias, A. Martin-Minguez, L. Borruel, A. Gomez-Iglesias, M. Reufer, M. Bou-Sanayeh, P. Brick, N. Linder, M. Ziegler, J. Tomm

Proceedings Volume 7597, 75971G (2010) https://doi.org/10.1117/12.841970

KEYWORDS: Nonabsorbing mirrors, Optical simulations, Absorption, Quantum wells, Mirrors, Temperature metrology, Solids, Aluminium gallium indium phosphide, Electro optical modeling, High power lasers

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Proceedings Article | 12 February 2010 Paper

Catastrophic optical mirror damage in diode lasers monitored during single pulse operation

Jens Tomm, Mathias Ziegler, Thomas Elsaesser, Henning Larsen, Paul Petersen, Peter Andersen, Sønnik Clausen, Ute Zeimer, David Fendler

Proceedings Volume 7616, 76161G (2010) https://doi.org/10.1117/12.839585

KEYWORDS: Semiconductor lasers, Pulsed laser operation, Mirrors, Temperature metrology, Thermography, Quantum wells, Cameras, Continuous wave operation, Scanning electron microscopy, Temporal resolution

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Proceedings Article | 3 February 2009 Paper

Bulk temperature mapping of broad area quantum dot lasers: modeling and micro-thermographic analysis

Jayanta Mukherjee, Mathias Ziegler, Julien LeClech, Jens Tomm, Brian Corbett, John McInerney, Johann Peter Reithmaier, S. Deubert, A. Forchel

Proceedings Volume 7230, 72300W (2009) https://doi.org/10.1117/12.808298

KEYWORDS: Thermal modeling, Finite element methods, Quantum dot lasers, Semiconductor lasers, Instrument modeling, Temperature metrology, Spatial resolution, Thermography, High power lasers, Cameras

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Proceedings Article | 3 February 2009 Paper

New approaches towards the understanding of the catastrophic optical damage process in in-plane diode lasers

Jens Tomm, Mathias Ziegler, Vadim Talalaev, Clemens Matthiesen, Thomas Elsaesser, Marwan Bou Sanayeh, Peter Brick, Martin Reufer

Proceedings Volume 7230, 72300V (2009) https://doi.org/10.1117/12.806701

KEYWORDS: Semiconductor lasers, Temperature metrology, Thermography, Optical damage, Cameras, Near field optics, Absorption, Infrared radiation, Quantum wells, Infrared imaging

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Proceedings Article | 8 May 2008 Paper

The physics of catastrophic optical damage in high-power AlGaInP laser diodes

M. Bou Sanayeh, P. Brick, W. Schmid, B. Mayer, M. Müller, M. Reufer, K. Streubel, M. Ziegler, J. Tomm, G. Bacher

Proceedings Volume 6997, 699703 (2008) https://doi.org/10.1117/12.779524

KEYWORDS: Aluminium gallium indium phosphide, Semiconductor lasers, Thermography, Temperature metrology, Absorption, Near field, Waveguides, Electroluminescence, Cameras, Physics

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Proceedings Article | 13 February 2008 Paper

Accurate determination of absolute temperatures of GaAs based high-power diode lasers

M. Ziegler, J. Tomm, F. Weik, T. Elsaesser, C. Monte, J. Hollandt, H. Kissel, G. Seibold, J. Biesenbach

Proceedings Volume 6876, 68761A (2008) https://doi.org/10.1117/12.758879

KEYWORDS: Semiconductor lasers, Thermography, High power lasers, Semiconductors, Cameras, Temperature metrology, Gallium arsenide, Transmittance, Semiconductor materials, Sensors

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Proceedings Article | 13 February 2008 Paper

Screening of high power laser diode bars in terms of stresses and thermal profiles

Jens Tomm, Mathias Ziegler, Tran Quoc Tien, Fritz Weik, Petra Hennig, Jens Meusel, Heiko Kissel, Gabriele Seibold, Jens Biesenbach, Guenther Groenninger, Gerhard Herrmann, Uwe Strauß

Proceedings Volume 6876, 687619 (2008) https://doi.org/10.1117/12.758877

KEYWORDS: Copper, Waveguides, Packaging, Pulsed laser operation, Indium, High power lasers, Diodes, Thermography, Quantum wells, Absorption

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Proceedings Article | 7 February 2007 Paper

Degradation behavior and thermal properties of red (650 nm) high-power diode single emitters and laser bars

Jens Tomm, Tran Tien, Mathias Ziegler, Fritz Weik, Bernd Sumpf, Martin Zorn, Ute Zeimer, Götz Erbert

Proceedings Volume 6456, 645606 (2007) https://doi.org/10.1117/12.696552

KEYWORDS: Semiconductor lasers, Quantum wells, High power lasers, Photons, Luminescence, Temperature metrology, Diodes, Visible radiation, Packaging, Waveguides

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Proceedings Article | 13 October 2006 Paper

Analysis of mechanical strain and temperature profiling in high-brightness parabolic bow-tie laser arrays

D. Masanotti, F. Causa, F. Weick, M. Ziegler, J. Tomm

Proceedings Volume 6368, 63680Y (2006) https://doi.org/10.1117/12.685138

KEYWORDS: Continuous wave operation, Semiconductor lasers, Pulsed laser operation, Thermography, Mid-IR, High power lasers, Copper, Spatial resolution, Cameras

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Showing 5 of 9 publications

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