Michael J. Petrillo
Consultant
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 March 2016 Paper
Proceedings Volume 9783, 97833T (2016) https://doi.org/10.1117/12.2216888
KEYWORDS: Sensors, Modulation transfer functions, Image sensors, Image quality, Data acquisition, Signal to noise ratio, Field emission displays, X-rays, X-ray imaging, Quantum electronics, Calibration, Image processing, Interference (communication), X-ray detectors

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top