Norihiro Yamamoto
Sr. Manager Engineering
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 March 2007 Paper
Proceedings Volume 6520, 65200Y (2007) https://doi.org/10.1117/12.711336
KEYWORDS: Polarization, Apodization, Pellicles, Transmittance, Matrices, Reticles, Jones matrices, Lithography, Critical dimension metrology, Zernike polynomials

Proceedings Article | 21 March 2006 Paper
Proceedings Volume 6154, 61544F (2006) https://doi.org/10.1117/12.657155
KEYWORDS: Photomasks, Polarization, Critical dimension metrology, Diffraction, Refractive index, Phase shifts, Binary data, Lithographic illumination, Optical testing, Mineralogy

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