Olexander Nahusko
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 October 2018 Paper
Ihor Studenyak, Olexander Nahusko, Vitalii Izai, Mladen Kranjčec, Peter Kúš, Marian Mikula, Kanat Mussabekov, Andrzej Kociubiński
Proceedings Volume 10808, 108084W (2018) https://doi.org/10.1117/12.2501508
KEYWORDS: Thin films, Absorption, Refractive index, Thin film deposition, Transmittance, Titanium dioxide, Sputter deposition, X-ray diffraction, Spectroscopy, Phonons

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