This paper reports on the assessment of a simple and economical self-assembly methodology to obtain reproducible substrates onto the optical fiber tip for surface-enhanced Raman spectroscopy (SERS) applications. The method relies on the use of the nanosphere lithography of the optical fiber end facet. A careful analysis has been carried out to investigate the capability of the proposed procedure to realize repeatable pattern on the optical fiber tip. Finally, we demonstrate the effective application of the patterned OFTs as SERS nanoprobes.
In this work, we report a straightforward and cost-effective fabrication route for the development of nano-patterned optical fiber tips. The technique is based on self-assembling polystyrene microspheres at the air/water interface and on their successive transferring on the fiber tip of single mode optical fiber. By applying to the fiber further treatments like particle size reduction, metal coating and sphere removal, different periodic structures have been conveniently realized. The morphological analysis reveals indeed the successful creation on the optical fiber tip of regular metallic-dielectric spheres’ arrays as well as metallic patterns with dimensional features down to a submicron scale. Finally, as proof of concept, we demonstrated the capability of the realized patterns to work as efficient Surface Enhanced Raman Spectroscopy (SERS) fiber probes.
This paper reports the development of a VHF PECVD process at 40.68 MHz for deposition of device-grade nc-Si:H. It
further reports the evaluation of textured ZnO:Al films produced by hollow cathode sputtering as regards their suitability
to serve as a TCO substrate for a-Si:H / nc-Si:H tandem device fabrication. The tandem devices were produced using an
established VHF PECVD process at 100 MHz. Both VHF processes are capable of producing similar nc-Si:H material
based on their analysis using micro-Raman spectroscopy. For the tandem junction devices, a peak in device efficiency
was obtained at a Raman crystalline fraction of 50-52 % and a microstructure parameter of 0.60-0.68. A best tandem
cell efficiency of 9.9% was achieved on HC ZnO compared to 11.3% on a reference Type-U SnO2 substrate.
Conference Committee Involvement (8)
Thin Films for Solar and Energy Technology VIII
28 August 2016 | San Diego, California, United States
Thin Films for Solar and Energy Technology VII
9 August 2015 | San Diego, California, United States
Thin Films for Solar and Energy Technology VI
17 August 2014 | San Diego, California, United States
Thin Film Solar Technology V
25 August 2013 | San Diego, California, United States
Thin Film Solar Technology IV
12 August 2012 | San Diego, California, United States
Thin Film Solar Technology III
21 August 2011 | San Diego, California, United States
Thin Film Solar Technology II
1 August 2010 | San Diego, California, United States
Thin Film Solar Technology
2 August 2009 | San Diego, California, United States
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