Parthasarathy Venkataraman
at Rochester Institute of Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 July 2000 Paper
Proceedings Volume 4000, (2000) https://doi.org/10.1117/12.388962
KEYWORDS: Interferometry, Diffraction, Phase shifting, Phase shifts, Photomasks, Optical testing, Prototyping, Spatial filters, Image quality, Monochromatic aberrations

Proceedings Article | 5 June 1998 Paper
Proceedings Volume 3331, (1998) https://doi.org/10.1117/12.309614
KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Optical coatings, Molybdenum, Silicon, Interfaces, Beryllium, Thin film coatings, Mirrors

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