Patricia D. Beard
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 8 December 1995 Paper
Proceedings Volume 2621, (1995) https://doi.org/10.1117/12.228214
KEYWORDS: Inspection, Transmittance, Photomasks, Optical proximity correction, Opacity, Manufacturing, Phase measurement, Databases, Defect detection, Phase shifts

Proceedings Article | 1 May 1994 Paper
Yair Eran, Ido Weinberg, Patricia Beard
Proceedings Volume 2196, (1994) https://doi.org/10.1117/12.174124
KEYWORDS: Inspection, Defect inspection, Image processing, Photomasks, Semiconducting wafers, Tolerancing, Databases

Proceedings Article | 15 February 1994 Paper
Nissim Elmaliach, Yair Eran, Shiree Shafrir, Carla Thoe, Patricia Beard
Proceedings Volume 2087, (1994) https://doi.org/10.1117/12.167263
KEYWORDS: Databases, Inspection, Computer aided design, Raster graphics, Data modeling, Visualization, Scanners, Photomask technology, Visual process modeling, Solid modeling

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