Prof. Pawel Kaminski Profile

Prof. Pawel Kaminski

at Instytut Technologii Materialów Elektronicznych

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 11 February 2020 Open Access

Influence of photon energy on conductivity of photoconductive semiconductor switches fabricated from semi-insulating GaP

K. Piwowarski, M. Suproniuk, P. Kamiński, B. Perka, R. Kozłowski, M. Teodorczyk

Proceedings Volume 11442, 114420M (2020) https://doi.org/10.1117/12.2565269

KEYWORDS: Switches, Semiconductors, Resistance, Gallium, Switching, Semiconductor materials, Control systems, Absorption

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Proceedings Article | 27 March 2019 Paper

Semi-insulating GaP as a material for manufacturing photoconductive semiconductor switches

M. Suproniuk, P. Kamiński, R. Kozłowski, M. Teodorczyk, A. Mirowska, E. Majda-Zdancewicz, M. Wierzbowski, K. Piwowarski, P. Paziewski

Proceedings Volume 11055, 1105503 (2019) https://doi.org/10.1117/12.2524108

KEYWORDS: Switches, Semiconducting wafers, Phosphorus, Electrodes, Chemical species, Silicon carbide, Manufacturing, Semiconductors, Gallium, Switching

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Proceedings Article | 17 April 2001 Paper

Deep-level defects in semi-insulating LT MBE GaAs

Roman Kozlowski, Pawel Kaminski, Peter Kordos, Michal Pawlowski, Robert Cwirko

Proceedings Volume 4413, (2001) https://doi.org/10.1117/12.425430

KEYWORDS: Gallium arsenide, Arsenic, Temperature metrology, Spectroscopy, Gallium, Molecular beam epitaxy, Defect detection, Crystals, Statistical analysis, Thin films

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Proceedings Article | 17 April 2001 Paper

Technique of low-frequency noise versus temperature for identification of deep-level defects in semiconductor materials

J. Cwirko, C. Przybysz, Robert Cwirko, Pawel Kaminski

Proceedings Volume 4413, (2001) https://doi.org/10.1117/12.425433

KEYWORDS: Semiconductor materials, Temperature metrology, Crystals, Spectroscopy, Semiconductors, Control systems, Liquids, Gallium arsenide, Optoelectronics, Electrons

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Proceedings Article | 17 April 2001 Paper

Analysis of two-dimensional PITS spectra for characterization of defect centers in high-resistivity materials

Michal Pawlowski, M. Miczuga, Pawel Kaminski, Roman Kozlowski

Proceedings Volume 4413, (2001) https://doi.org/10.1117/12.425431

KEYWORDS: Silicon, Temperature metrology, Data centers, Spectroscopy, Computer programming, Information operations, Semiconductors, Solids, Electronics, Semiconductor materials

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Proceedings Article | 8 April 1999 Paper

Electronic properties of grown-in defects in semi-insulating GaAs

Roman Kozlowski, Michal Pawlowski, Pawel Kaminski, J. Cwirko

Proceedings Volume 3725, (1999) https://doi.org/10.1117/12.344736

KEYWORDS: Semiconducting wafers, Gallium arsenide, Information operations, Arsenic, Crystals, Copper, Manufacturing, Spectroscopy, Quartz, Oxygen

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Proceedings Article | 14 July 1997 Paper

High-resolution PITS studies of deep-level defects in semi-insulating GaAs and InP

Pawel Kaminski, Michal Pawlowski, Roman Kozlowski, Robert Cwirko, M. Palczewska

Proceedings Volume 3178, (1997) https://doi.org/10.1117/12.280743

KEYWORDS: Gallium arsenide, Electrons, Semiconducting wafers, Spectroscopy, Crystals, Solids, Photonic integrated circuits, Iron, Arsenic, Liquid crystals

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