Prof. Qinggang Liu Profile

Prof. Qinggang Liu

SPIE Involvement:

Author

Publications (13)

Proceedings Article | 10 June 2024 Poster + Paper

Spectral response analysis of 1D photonic crystals

Qinggang Liu, Yaopu Lang, Qi Wang, Mantong Chen

Proceedings Volume 12991, 129910Z (2024) https://doi.org/10.1117/12.3016645

KEYWORDS: Reflection, Photonic crystals, Incident light, Refractive index, Reflectivity, Modulation, Spectral response, Sensors, Prisms, Polarized light

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Proceedings Article | 12 March 2020 Paper

Spectral analysis for SPR sensor with monolayer metal film

Yaopu Lang, Chong Yue, Xinglin Zhou, Qinggang Liu

Proceedings Volume 11440, 114400B (2020) https://doi.org/10.1117/12.2543345

KEYWORDS: Reflectivity, Metals, Gold, Silver, Copper, Reflection, Light sources, Sensors, Interfaces, Dielectrics

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Proceedings Article | 12 March 2020 Paper

Enhancement in sensitivity of guided-wave surface plasmon resonance sensor using graphene

Chong Yue, Yaopu Lang, Xinglin Zhou, Qinggang Liu

Proceedings Volume 11440, 1144002 (2020) https://doi.org/10.1117/12.2539020

KEYWORDS: Sensors, Graphene, Surface plasmons, Waveguides, Gold, Resonance enhancement, Thin films, Refractive index, Zinc oxide, Biosensing

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Proceedings Article | 11 April 2019 Paper

Impact of surface plasmon resonance on angular spin splitting of light

Qinggang Liu, Yaopu Lang, Zirui Qin, Chong Yue, Xinglin Zhou

Proceedings Volume 11028, 110281A (2019) https://doi.org/10.1117/12.2519919

KEYWORDS: Reflection, Interfaces, Gold, Surface plasmons, Photons, Metals, Glasses, Reflectivity, Spin polarization

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Proceedings Article | 12 January 2018 Paper

Impact of the incident light polarization on photonic spin splitting around the Brewster angle

Zirui Qin, Qinggang Liu, Chao Liu, Chong Yue, Yaopu Lang

Proceedings Volume 10622, 1062208 (2018) https://doi.org/10.1117/12.2286291

KEYWORDS: Polarization, Photon polarization, Gaussian beams, Photons, Metrology, Beam splitters, Modulation, Glasses, Solids, Chaos

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Proceedings Article | 26 June 2017 Paper

Phase detection model and method for SPR effect modulated by metallic thickness

Qinggang Liu, Yang Li, Zirui Qin, Chong Yue

Proceedings Volume 10329, 103293Q (2017) https://doi.org/10.1117/12.2270091

KEYWORDS: Polarization, Modulation, Surface plasmons, Beam splitters, Mathematical modeling, Prisms, Sensors, Algorithm development, Polarizers, Metals, Thin films, Reflectivity, Reflection, Light sources

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Proceedings Article | 15 September 2016 Paper

A characterization method for the metal thin film

Qinggang Liu, Xian Xie, Zirui Qin, Chao Liu

Proceedings Volume 9927, 99271N (2016) https://doi.org/10.1117/12.2236268

KEYWORDS: Metals, Reflection, Prisms, Surface plasmons, Thin films, Reflectance spectroscopy, Interfaces, Electrons, Dielectrics, Gold

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Proceedings Article | 8 October 2015 Paper

Moiré fringe method for roll angular displacement measurement

Xue Yu, Chao Liu, Xian Xie, Yaopu Lang, Qinggang Liu

Proceedings Volume 9677, 96771R (2015) https://doi.org/10.1117/12.2199823

KEYWORDS: Ronchi rulings, Charge-coupled devices, Diffraction, Optical testing, Diffraction gratings, Optical components, Laser sources, Collimation, Prisms, Spectroscopy

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Proceedings Article | 31 December 2008 Paper

Optimum design of 2D micro-angle sensor

Qinggang Liu, Heng Zhao, Xiaona Lou, Ningchuan Jiang, Xiaotang Hu

Proceedings Volume 7130, 713009 (2008) https://doi.org/10.1117/12.819545

KEYWORDS: Sensors, Modulation, Signal processing, Calibration, Prisms, Interference (communication), Photodiodes, Electronic filtering, Optical filters, Reflectivity

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Proceedings Article | 28 October 2006 Paper

Comparison of the effect of TiOx lines number in the tunneling junctions to the tunneling phenomenon

Chaoyan Zhang, Qinggang Liu, Shilin Zhang, Dachao Li, Xiaotang Hu

Proceedings Volume 6358, 63580B (2006) https://doi.org/10.1117/12.717637

KEYWORDS: Titanium, Electrodes, Atomic force microscopy, Transistors, Nanolithography, Sputter deposition, Atomic force microscope, Nanostructures, Humidity, Oxidation

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Proceedings Article | 9 February 2005 Paper

Current detection during tip-induced anodic oxidation of titanium by atomic force microscope

Dengfeng Kuang, Qinggang Liu, Weilian Guo, Shilin Zhang, Xiaotang Hu

Proceedings Volume 5635, (2005) https://doi.org/10.1117/12.572123

KEYWORDS: Titanium, Oxides, Atomic force microscopy, Sputter deposition, Electrons, Nanolithography, Atomic force microscope, Scanning tunneling microscopy, Interfaces, Oxidation

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