Mr. Rick K. Dorval Profile

Rick K. Dorval

CTO at Safran Defense & Space Inc Optronics

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Author

Publications (6)

Proceedings Article | 22 March 2005 Paper

Spatial 3D infrastructure: display-independent software framework, high-speed rendering electronics, and several new displays

Won-Suk Chun, Joshua Napoli, Oliver Cossairt, Rick Dorval, Deirdre Hall, Thomas Purtell, James Schooler, Yigal Banker, Gregg Favalora

Proceedings Volume 5664, (2005) https://doi.org/10.1117/12.589320

KEYWORDS: 3D displays, Visualization, 3D image processing, Electronics, 3D volumetric displays, Projection systems, Digital micromirror devices, OpenGL, 3D applications, Software frameworks

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Proceedings Article | 28 August 2002 Paper

100-million-voxel volumetric display

Gregg Favalora, Joshua Napoli, Deirdre Hall, Rick Dorval, Michael Giovinco, Michael Richmond, Won Chun

Proceedings Volume 4712, (2002) https://doi.org/10.1117/12.480930

KEYWORDS: 3D displays, Visualization, 3D volumetric displays, 3D image processing, Projection systems, Digital micromirror devices, Human-machine interfaces, Mirrors, Spatial light modulators

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Proceedings Article | 22 June 2001 Paper

Volumetric three-dimensional display system with rasterization hardware

Gregg Favalora, Rick Dorval, Deirdre Hall, Michael Giovinco, Joshua Napoli

Proceedings Volume 4297, (2001) https://doi.org/10.1117/12.430821

KEYWORDS: 3D displays, Visualization, 3D volumetric displays, 3D image processing, Raster graphics, Projection systems, OpenGL, Digital signal processing, Electronics

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Proceedings Article | 10 February 1995 Paper

Offset scanning and field widening: maintaining the radiometric performance of a Fourier transform spectrometer (FTS) with high spectral discrimination capability

James Engel, Rick Dorval

Proceedings Volume 2366, (1995) https://doi.org/10.1117/12.205559

KEYWORDS: Interferometers, Mirrors, Fourier transforms, Spectrometers, Sensors, Modulation, Wavefronts, Signal to noise ratio, Spectral resolution, Feature extraction

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Proceedings Article | 17 October 1994 Paper

Fourier transform spectrometer (FTS) systems with diode-based referencing and autoalignment capabilities

James Engel, Rick Dorval

Proceedings Volume 2269, (1994) https://doi.org/10.1117/12.188695

KEYWORDS: Semiconductor lasers, Sensors, Spectroscopy, Fourier transforms, Infrared technology, Mirrors, Helium neon lasers, Interferometers, Infrared sensors, Detector arrays

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Proceedings Article | 22 January 1993 Paper

Dynamic interferometer alignment and its utility in UV Fourier transform spectrometer systems

Rick Dorval, James Engel, Geert Wijntjes

Proceedings Volume 1764, (1993) https://doi.org/10.1117/12.140859

KEYWORDS: Ultraviolet radiation, Mirrors, Semiconductor lasers, Sensors, Optical alignment, Spectroscopy, Interferometers, Signal detection, Fourier transforms, Metrology

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Showing 5 of 6 publications

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