Mr. Ryoji Hagiwara Profile

Ryoji Hagiwara

Manager of Mask Repair at SII Nanotechnology Inc

SPIE Involvement:

Author

Publications (21)

Proceedings Article | 22 July 2014 Paper

Paper

The large size telescope of the Cherenkov Telescope Array

G. Ambrosi, Y. Awane, H. Baba, A. Bamba, M. Barceló, U. Barres de Almeida, J. Barrio, O. Blanch Bigas, J. Boix, L. Brunetti, E. Carmona, E. Chabanne, M. Chikawa, R. Colin, J. Cortina, J. Contreras, F. Dazzi, A. De Angelis, G. Deleglise, C. Delgado, C. Díaz, A. Fiasson, D. Fink, N. Fouque, L. Freixas, C. Fruck, A. Gadola, R. García, D. Gascon, N. Geffroy, N. Giglietto, F. Giordano, F. Grañena, S. Gunji, R. Hagiwara, N. Hamer, Y. Hanabata, T. Hassan, K. Hatanaka, K. Hirotani, S. Inoue, Y. Inoue, K. Ioka, C. Jablonski, M. Kagaya, H. Katagiri, T. Kishimoto, K. Kodani, K. Kohri, Y. Konno, S. Koyama, H. Kubo, J. Kushida, G. Lamanna, T. Le Flour, E. Lorenz, R. López, M. López-Moya, P. Majumdar, A. Manalaysay, M. Mariotti, G. Martínez, M. Martínez, D. Mazin, J. Miranda , R. Mirzoyan, I. Monteiro, A. Moralejo, K. Murase, S. Nagataki, D. Nakajima, T. Nakamori, K. Nishijima, K. Noda, A. Nozato, Y. Ohira, M. Ohishi, H. Ohoka, A. Okumura, R. Orito, J. Panazol, D. Paneque, R. Paoletti, J. Paredes, G. Pauletta, S. Podkladkin, J. Prast, R. Rando, O. Reimann, M. Ribó, S. Rosier-Lees, K. Saito, T. Saito, Y. Saito, N. Sakaki, R. Sakonaka, A. Sanuy, H. Sasaki, M. Sawada, V. Scalzotto, S. Schultz, T. Schweizer, T. Shibata, S. Shu, J. Sieiro, V. Stamatescu, S. Steiner, U. Straumann, R. Sugawara, H. Tajima, H. Takami, S. Tanaka, M. Tanaka, L. Tejedor, Y. Terada, M. Teshima, T. Totani, H. Ueno, K. Umehara, A. Vollhardt, R. Wagner, H. Wetteskind, T. Yamamoto, R. Yamazaki, A. Yoshida, T. Yoshida, T. Yoshikoshi

Proceedings Volume 9145, 91450P (2014) https://doi.org/10.1117/12.2054605

KEYWORDS: Telescopes, Mirrors, Electronics, Cameras, Reflectivity, Physics, Space telescopes, Gamma radiation, Optical instrument design, Atmospheric Cherenkov telescopes

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Proceedings Article | 17 October 2008 Paper

Paper

Ga implantation and interlayer mixing during FIB repair of EUV mask defects

Yasushi Nishiyama, Tsuyoshi Amano, Hiroyuki Shigemura, Tsuneo Terasawa, Osamu Suga, Tomokazu Kozakai, Fumio Aramaki, Kensuke Shiina, Anto Yasaka, Ryoji Hagiwara

Proceedings Volume 7122, 71222J (2008) https://doi.org/10.1117/12.801428

KEYWORDS: Etching, Chemical species, Ions, Silicon, Reflectivity, Chromium, Extreme ultraviolet, Molybdenum, Gallium, Absorption

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Proceedings Article | 17 October 2008 Paper

Paper

Study of EUVL mask defect repair using FIB-GAE method

Tsuyoshi Amano, Yasushi Nishiyama, Hiroyuki Shigemura, Tsuneo Terasawa, Osamu Suga, Kensuke Shiina, Fumio Aramaki, Ryoji Hagiwara, Anto Yasaka

Proceedings Volume 7122, 71222H (2008) https://doi.org/10.1117/12.801214

KEYWORDS: Etching, Image processing, Reflectivity, Chromium, Scanning electron microscopy, Bridges, Photomasks, Extreme ultraviolet, Extreme ultraviolet lithography, Semiconducting wafers

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Proceedings Article | 19 May 2008 Paper

Paper

Evaluation of defect repair of EUVL mask pattern using FIB-GAE method

Tsuyoshi Amano, Yasushi Nishiyama, Hiroyuki Shigemura, Tsuneo Terasawa, Osamu Suga, Ryoji Hagiwara, Kensuke Shiina, Shuichi Kikuchi, Anto Yasaka

Proceedings Volume 7028, 70281T (2008) https://doi.org/10.1117/12.793071

KEYWORDS: Etching, Image processing, Reflectivity, Scanning electron microscopy, Bridges, Photomasks, Extreme ultraviolet lithography, Critical dimension metrology, Tantalum, Isotropic etching

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Proceedings Article | 19 May 2008 Paper

Paper

Comparison of verification methods for OASIS files: hierarchical or flat?

Kokoro Kato, Yoshiyuki Taniguchi, Masakazu Endo, Kuninori Nishizawa, Tadao Inoue, Toshiaki Fujii

Proceedings Volume 7028, 702834 (2008) https://doi.org/10.1117/12.793111

KEYWORDS: Nanotechnology, Data modeling, Error analysis, Parallel processing, Data processing, Photomasks, Explosives, Optical proximity correction, Data conversion, Standards development

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Proceedings Article | 19 May 2008 Paper

Paper

Damage analysis of EUV mask under Ga focused ion beam irradiation

Yasushi Nishiyama, Tsuyoshi Amano, Hiroyuki Shigemura, Tsuneo Terasawa, Osamu Suga, Tomokazu Kozakai, Syuichi Kikuchi, Kensuke Shiina, Anto Yasaka, Ryoji Hagiwara

Proceedings Volume 7028, 70280J (2008) https://doi.org/10.1117/12.793026

KEYWORDS: Etching, Chemical species, Ions, Silicon, Reflectivity, Ion beams, Photomasks, Extreme ultraviolet, Gallium, Absorption

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Proceedings Article | 1 November 2007 Paper

Paper

Mask rule check using priority information of mask patterns

Kokoro Kato, Yoshiyuki Taniguchi, Kuninori Nishizawa, Masakazu Endo, Tadao Inoue, Ryouji Hagiwara, Anto Yasaka

Proceedings Volume 6730, 67304F (2007) https://doi.org/10.1117/12.746549

KEYWORDS: Error analysis, Manufacturing, Inspection, Software development, Design for manufacturing, Photomasks, Optical proximity correction, SRAF, Data conversion, Design for manufacturability

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Proceedings Article | 30 October 2007 Paper

Paper

A semi-automated AFM photomask repair process for manufacturing application using SPR6300

Mario Dellagiovanna, Hidenori Yoshioka, Hiroyuki Miyashita, Shiaki Murai, Takuya Nakaue, Osamu Takaoka, Atsushi Uemoto, Syuichi Kikuchi, Ryoji Hagiwara, Stephane Benard

Proceedings Volume 6730, 673020 (2007) https://doi.org/10.1117/12.746405

KEYWORDS: Diamond, Contamination, Image processing, Scanners, Particles, Manufacturing, Atomic force microscopy, Scanning electron microscopy, Photomasks, Critical dimension metrology

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Proceedings Article | 23 October 2006 Paper

Paper

Advanced photomask repair technology for 65-nm lithography

Fumio Aramaki, Tomokazu Kozakai, Masashi Muramatsu, Yasuhiko Sugiyama, Yoshihiro Koyama, Osamu Matsuda, Katsumi Suzuki, Mamoru Okabe, Toshio Doi, Ryoji Hagiwara, Tatsuya Adachi, Anto Yasaka, Yoshiyuki Tanaka, Osamu Suga, Naoki Nishida, Youichi Usui

Proceedings Volume 6349, 63491E (2006) https://doi.org/10.1117/12.691195

KEYWORDS: Lithography, Opacity, Etching, Scanning electron microscopy, Data processing, Process control, Transmittance, Photomasks, Computer aided design, CAD systems

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Proceedings Article | 20 May 2006 Paper

Paper

Advanced photomask repair technology for 65-nm lithography

Fumio Aramaki, Tomokazu Kozakai, Yasuhiko Sugiyama, Masashi Muramatsu, Yoshihiro Koyama, Osamu Matsuda, Katsumi Suzuki, Mamoru Okabe, Ryoji Hagiwara, Anto Yasaka, Tatsuya Adachi, Yoshiyuki Tanaka, Osamu Suga, Naoki Nishida, Youichi Usui

Proceedings Volume 6283, 628310 (2006) https://doi.org/10.1117/12.681859

KEYWORDS: Lithography, Sensors, Etching, Quartz, Chromium, Scanning electron microscopy, Transmittance, Photomasks, Critical dimension metrology, Visibility

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Proceedings Article | 9 November 2005 Paper

Paper

Advanced photomask repair technology for 65nm lithography (4)

Yasutoshi Itou, Yoshiyuki Tanaka, Osamu Suga, Yasuhiko Sugiyama, Ryoji Hagiwara, Haruo Takahashi, Osamu Takaoka, Tomokazu Kozakai, Osamu Matsuda, Katsumi Suzuki, Mamoru Okabe, Syuichi Kikuchi, Atsushi Uemoto, Anto Yasaka, Tatsuya Adachi, Naoki Nishida

Proceedings Volume 5992, 59924Y (2005) https://doi.org/10.1117/12.632756

KEYWORDS: Lithography, Opacity, Quartz, Ions, Monte Carlo methods, Transmittance, Photomasks, Gallium, Binary data, 193nm lithography

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Proceedings Article | 28 June 2005 Paper

Paper

Advanced photomask repair technology for 65nm lithography (3)

Yasutoshi Itou, Yoshiyuki Tanaka, Yasuhiko Sugiyama, Ryoji Hagiwara, Haruo Takahashi, Osamu Takaoka, Tomokazu Kozakai, Osamu Matsuda, Katsumi Suzuki, Mamoru Okabe, Syuichi Kikuchi, Atsushi Uemoto, Anto Yasaka, Tatsuya Adachi, Naoki Nishida

Proceedings Volume 5853, (2005) https://doi.org/10.1117/12.617344

KEYWORDS: Lithography, Opacity, Etching, Control systems, Atomic force microscopy, Photomasks, Computer aided design, Acoustics, Surface conduction electron emitter displays, 193nm lithography

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Proceedings Article | 6 December 2004 Paper

Paper

Advanced photomask repair technology for 65-nm lithography (2)

Yasutoshi Itou, Yoshiyuki Tanaka, Nobuyuki Yoshioka, Yasuhiko Sugiyama, Ryoji Hagiwara, Haruo Takahashi, Osamu Takaoka, Tomokazu Kozakai, Osamu Matsuda, Katsumi Suzuki, Mamoru Okabe, Syuichi Kikuchi, Atsushi Uemoto, Anto Yasaka, Tatsuya Adachi, Naoki Nishida, Toshiya Ozawa

Proceedings Volume 5567, (2004) https://doi.org/10.1117/12.578615

KEYWORDS: Lithography, Imaging systems, Etching, Chromium, Control systems, Transmittance, Photomasks, Computer aided design, Surface conduction electron emitter displays, 193nm lithography

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Proceedings Article | 20 August 2004 Paper

Paper

FIB mask repair technology for electron projection lithography

Yoh Yamamoto, Masakatsu Hasuda, Hiroyuki Suzuki, Makoto Sato, Osamu Takaoka, Hiroshi Matsumura, Noboru Matsumoto, Kouji Iwasaki, Ryoji Hagiwara, Katsumi Suzuki, Yutaka Ikku, Kazuo Aita, Takashi Kaito, Tatsuya Adachi, Anto Yasaka, Jiro Yamamoto, Teruo Iwasaki, Masaki Yamabe

Proceedings Volume 5446, (2004) https://doi.org/10.1117/12.557731

KEYWORDS: Electron beam lithography, Imaging systems, Opacity, Sensors, Etching, Image processing, Silicon, Ion beams, Photomasks, Projection lithography

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Proceedings Article | 20 August 2004 Paper

Paper

Advanced photomask repair technology for 65-nm lithography (1)

Yasutoshi Itou, Yoshiyuki Tanaka, Nobuyuki Yoshioka, Yasuhiko Sugiyama, Ryoji Hagiwara, Haruo Takahashi, Osamu Takaoka, Junichi Tashiro, Katsumi Suzuki, Mamoru Okabe, Syuichi Kikuchi, Atsushi Uemoto, Anto Yasaka, Tatsuya Adachi, Naoki Nishida, Toshiya Ozawa

Proceedings Volume 5446, (2004) https://doi.org/10.1117/12.557789

KEYWORDS: Carbon, Lithography, Image resolution, Control systems, Raman spectroscopy, Transmittance, Photomasks, Computer aided design, Surface conduction electron emitter displays, 193nm lithography

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Proceedings Article | 17 December 2003 Paper

Paper

Advanced FIB mask repair technology for 90-nm/ArF lithography: III

Yoshiyuki Tanaka, Yasutoshi Itou, Nobuyuki Yoshioka, Ryoji Hagiwara, Anto Yasaka, Osamu Takaoka, Tomokazu Kozakai, Yoshihiro Koyama, Hiroshi Sawaragi, Yasuhiko Sugiyama, Masashi Muramatsu, Toshio Doi, Katsumi Suzuki, Mamoru Okabe, Masashi Shinohara, Osamu Matsuda, Kazuo Aita, Tatsuya Adachi, Yasutaka Morikawa, Masaharu Nishiguchi, Yasushi Satoh, Naoya Hayashi

Proceedings Volume 5256, (2003) https://doi.org/10.1117/12.518026

KEYWORDS: Lithography, Imaging systems, Opacity, Image processing, Ions, Printing, Transmittance, Photomasks, Binary data, Surface conduction electron emitter displays

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Proceedings Article | 28 August 2003 Paper

Paper

Advanced FIB mask repair technology for 100-nm/ArF lithography: II

Ryoji Hagiwara, Anto Yasaka, Kazuo Aita, Osamu Takaoka, Yoshihiro Koyama, Tomokazu Kozakai, Toshio Doi, Masashi Muramatsu, Katsumi Suzuki, Yasuhiko Sugiyama, Osamu Matsuda, Mamoru Okabe, Shoji Shinohara, Masakatsu Hasuda, Tatsuya Adachi, Yasutaka Morikawa, Masaharu Nishiguchi, Yasushi Sato, Naoya Hayashi, Toshiya Ozawa, Yoshihiro Tanaka, Nobuyuki Yoshioka

Proceedings Volume 5130, (2003) https://doi.org/10.1117/12.504212

KEYWORDS: Lithography, Imaging systems, Opacity, Scanners, Ions, Printing, Transmittance, Photomasks, Semiconducting wafers, Binary data

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Proceedings Article | 27 December 2002 Paper

Paper

Advanced FIB mask repair technology for 100-nm/ArF lithography

Ryoji Hagiwara, Anto Yasaka, Kazuo Aita, Osamu Takaoka, Yoshihiro Koyama, Tomokazu Kozakai, Toshio Doi, Masashi Muramatsu, Katsumi Suzuki, Yasuhiko Sugiyama, Hiroshi Sawaragi, Mamoru Okabe, Shoji Shinohara, Masakatsu Hasuda, Tatsuya Adachi, Yasutaka Morikawa, Masaharu Nishiguchi, Yasushi Sato, Naoya Hayashi, Toshiya Ozawa, Yoshihiro Tanaka, Nobuyuki Yoshioka

Proceedings Volume 4889, (2002) https://doi.org/10.1117/12.467357

KEYWORDS: Lithography, Data modeling, Imaging systems, Opacity, Image processing, Ions, Atomic force microscopy, Transmittance, Photomasks, Binary data

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Proceedings Article | 5 September 2001 Paper

Paper

Advanced FIB mask repair technology for ArF lithography: III

Ryoji Hagiwara, Anto Yasaka, Osamu Takaoka, Tomokazu Kozakai, S. Yabe, Yoshihiro Koyama, Masashi Muramatsu, Toshio Doi, Kenji Suzuki, Mamoru Okabe, Kazuo Aita, Tatsuya Adachi, Shinji Kubo, Nobuyuki Yoshioka, Hiroaki Morimoto, Yasutaka Morikawa, Kazuya Iwase, Naoya Hayashi

Proceedings Volume 4409, (2001) https://doi.org/10.1117/12.438373

KEYWORDS: Semiconductors, Lithography, Imaging systems, Opacity, Ions, Manufacturing, Transmittance, Photomasks, Prototyping, 193nm lithography

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Proceedings Article | 22 January 2001 Paper

Paper

Advanced FIB mask repair technology for ArF lithography: II

Shinji Kubo, Koji Hiruta, Hiroaki Morimoto, Anto Yasaka, Ryoji Hagiwara, Tatsuya Adachi, Yasutaka Morikawa, Kazuya Iwase, Naoya Hayashi

Proceedings Volume 4186, (2001) https://doi.org/10.1117/12.410689

KEYWORDS: Carbon, Lithography, Opacity, Etching, Ions, Ion beams, Transmittance, Photomasks, Semiconducting wafers, Phase shifts

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Proceedings Article | 19 July 2000 Paper

Paper

Advanced FIB mask repair technology in ArF lithography

Koji Hiruta, Shinji Kubo, Hiroaki Morimoto, Anto Yasaka, Ryoji Hagiwara, Tatsuya Adachi, Yasutaka Morikawa, Kazuya Iwase, Naoya Hayashi

Proceedings Volume 4066, (2000) https://doi.org/10.1117/12.392089

KEYWORDS: Carbon, Lithography, Opacity, Ions, Atomic force microscopy, Laser irradiation, Ion beams, Transmittance, Photomasks, Semiconducting wafers

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Showing 5 of 21 publications

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