Ms. Ruta Pakalnyte Profile

Ruta Pakalnyte

at LIDARIS Ltd

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 11 September 2020 Poster + Presentation

Direct comparison of laser-induced damage threshold testing protocols (Part II): Transmissive Optics and Monte Carlo simulations

Rūta Pakalnytė, Egidijus Pupka, Andrius Melninkaitis, Linas Smalakys

Proceedings Volume 11514, 115141O (2020) https://doi.org/10.1117/12.2571902

KEYWORDS: Laser induced damage, Laser damage threshold, Monte Carlo methods, Silica, Laser sources, Raster graphics, Antireflective coatings, Neodymium, YAG lasers

Read Abstract +

Proceedings Article | 11 September 2020 Presentation

Lithuanian inputs to new edition of ISO Standard for laser-induced damage threshold testing

Andrius Melninkaitis, Linas Smalakys, Egidijus Pupka, Gintare Batavičiute, Ruta Pakalnyte, Lina Vigricaite, Urte Kimbaraite, Marijus Mickus, Justinas Galinis

Proceedings Volume 11514, 115140D (2020) https://doi.org/10.1117/12.2571928

KEYWORDS: Standards development, Laser induced damage, Laser damage threshold, Laser optics, Optics manufacturing, Photonics, Monte Carlo methods, Analytical research

Read Abstract +

Quality standards are the basis for establishing a common ground between both research institutions and commercial organizations that exchange quantitative information about product features and related issues. In the rapidly changing world, the field of photonics is at the forefront of innovation: research, development, and manufacturing of new types of optics and lasers take place daily. In this context, new important aspects and limitations of the current damage testing approach become apparent. Accordingly, the ISO family of standards (ISO 21254) related to laser-induced damage threshold testing is reviewed and updated regularly. Various inputs into laser-induced damage testing were collected over the years by Lithuanian laser-induced damage community, which is a long-time practitioner of the current and previous revisions of ISO standards. Within this presentation, an attempt is made to contribute to the tremendous work that has already been done. Two types of efforts are made. First of all, we seek to identify weak points, edge cases and areas that leave some space for various misinterpretations and systematic errors. Secondly, we propose possible solutions (with corresponding Monte Carlo simulations for validation) that are currently in practice at laboratories of Lidaris UAB and Laser Research Center of Vilnius University. The suggested inputs are mostly related to definitions of damage criteria, test procedures, analysis of results, selection of appropriate testing protocols and their parameters as well as data representation. By no means, our observations seek to diminish the value of present approaches. As imperfect as they are, current standards were the only appropriate reference for a long time and proved to be adequate in most cases. We believe that the idea of a single protocol that would address all the issues of the community is flawed (considering the wide gamut of optics and lasers), therefore different testing protocols should be viewed as tools to address different problems. We also hope that some of our quantitative inputs could bring more clarity to preconceptions about laser-induced damage testing and significantly improve current approaches.

Proceedings Article | 17 December 2019 Paper

Direct comparison of laser-induced damage threshold testing protocols on dielectric mirrors: effect of nanosecond laser pulse shape at NIR and UV wavelengths

Rūta Pakalnytė, Egidijus Pupka, Andrius Melninkaitis

Proceedings Volume 11173, 1117318 (2019) https://doi.org/10.1117/12.2536456

KEYWORDS: Laser induced damage, Ultraviolet radiation, Laser damage threshold, Dielectric mirrors, Pulsed laser operation, Q switched lasers, Statistical analysis, Optical coatings

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years