Recent developments in the Mid Wave InfraRed (MWIR) optical domain were made on materials, optical design and
manufacturing. They answer increasing demands for more compact, less temperature dependent optical systems with
increased optical performances and complexity (multi- or hyper- spectral imagery). At the same time, the
characterization of these components has become strategic and requires solutions with higher performance.
The optical quality of such devices is measured by wave front sensing techniques. PHASICS previously developed wave
front sensors based on Quadri-Wave Lateral Shearing Interferometry (QWLSI) using broadband microbolometers
cameras for infrared measurements. However they suffer from reduced light sensitivity in the MWIR domain, which
limits their use with broadband sources such as black bodies. To meet metrology demands, we developed an innovative
wave front sensor. This instrument combines the metrological qualities of QWLSI with the radiometric performances of
a last generation detection block (Infrared Detector Dewar Cooler Assembly, IDDCA) with a quantum infrared focal
plane array (IRFPA) of HgCdTe technology.
The key component of QWLSI is a specific diffractive grating placed a few millimeters from the focal plane array. This
requirement implies that this optics should be integrated inside the IDDCA. To achieve this, we take advantage of the
experience acquired from recent developments with optics integrated in IDDCA. Thanks to this approach, we developed
a high spatial resolution MWIR wave front sensor (160x128 points) with a high sensitivity for accurate measurements
under low-flux conditions.
This paper will present the instrument technological solutions, the development key steps and experimental results on
various metrology applications.
The Quadri-Wave Lateral Shearing Interferometry (QWLSI) is an innovative wave front sensing technique that is
commercially available for MWIR and LWIR applications. We present this technology and its application to the
metrology, on and off-axis, of infrared imaging systems. The bench is only composed of a collimated reference beam
that creates a source point at infinity, the objective to analyze and the sensor placed a few millimeters after the focal spot.
Thanks to this direct measurement configuration, the alignment process is very simple and fast. A complete
characterization (aberrations, MTF, field curvature) for several field points is possible within a few minutes.
We present the application of Quadri-Wave Lateral Shearing Interferometry (QWLSI), a wave front sensing technique,
to characterize optical beams at infrared wavelengths from 2 to 16μm with a single instrument. We apply this technique
to qualify optical systems dedicated to MWIR (λ within 3 and 5μm) and LWIR (λ within 8 and 14μm) wavelength
ranges. The QWLSI offers the crucial advantage that it yields an analyzed wave front without the use of a reference arm
and consequent time consuming alignment. The qualification of an optical system with QWLSI gives a complete
diagnostic, from the aberration cartography to the PSF and MTF curves for every direction in one single measurement. In
this paper, we first present the QWLSI technology and its main features, we also detail an experimental comparison
between our MTF measurement and the results given by a classical MTF test bench. We finally show the experimental
analysis of an infrared lens at two different wavelengths, one in the MWIR range (λ=3.39μm) and the other in the LWIR
range (λ=10.6μm).
We present the application of Quadri-Wave Lateral Shearing Interferometry (QWLSI), a wave front sensing technique,
to characterize optical beams at infrared wavelengths from 2 to 16μm with a single instrument. This technique can be
used to quantify the quality of optical systems (like thermal infrared lenses) by measuring their aberrations. It can also
evaluate laser sources in the infrared range like some gas lasers (HeNe laser or CO2 laser), infrared Optical Parametric
Oscillator laser sources or Quantum Cascade Laser sources. In all cases, QWLSI offers the crucial advantage that it
yields an analyzed wave front without the use of a reference arm and consequent time consuming alignment. In this
paper, we first present the single interferometer which can be used with wavelength within 2 and 16μm, covering this
way the MWIR (λ within 3 and 5μm) and LWIR (λ within 8 and 14μm) ranges. We then present the characterization of
two gas lasers: an infrared HeNe lasers (λ=3.39μm) and a CO2 laser (λ=10.6μm) with this instrument. We finally show
the experimental analysis of an infrared lens at two different wavelengths, one in the MWIR range (λ=3.39μm) and the
other in the LWIR range (λ=10.6μm). λ
We present the application of Quadri-Wave Lateral Shearing Interferometry (QWLSI), a wave front sensing technique, to characterize thermal infrared lenses for wavelengths within 8 and 14μm. Wave front sensing is not only a tool to quantify optical quality, but also to map the local (dust, scratches) or global possible defects. This method offers the crucial advantage that it yields an analyzed wave front without the use of a reference arm and consequent time consuming alignment. Moreover thanks to the acceptance of QWLSI to high numerical aperture beams, no additional optics is required. This makes lens characterization convenient and very fast. We particularly show the experimental characterization of single Germanium lens and finally present the characterization of complex optical imaging systems for high-performance infrared cameras. The analysis is made in conditions that are very close to the usual conditions of the camera use; that is to say, directly in the convergent beam and in polychromatic (black body) light.
We present the application of Quadri-Wave Lateral Shearing Interferometry (QWLSI), a wave front sensing technique,
to characterize synthetic intraocular lens (IOL). Wave front sensing is not only a tool to quantify optical quality, but also to map the local (dust, scratches) or global possible defects. This method offers the crucial advantage that it yields an analyzed wave front without the use of a reference arm and consequent time consuming alignment. Moreover thanks to the acceptance of QWLSI to high numerical aperture beams, no additional optics is required. This makes lens characterization convenient and very fast. We will first explain the QWLSI design and metrological properties (high resolution and dynamic) and its analysis features (aberration measurement, MTF evaluation). We will present our device KALEO for characterization of IOLs. We will particularly show aberrations and MTF measurements of monofocal spherical IOLs. We will present how the QWLSI can answer to the specific analysis of aspherical IOLs. We will finally show a complete characterization of multifocal IOLs in one measurement helping the propagation theory.
Lateral shearing interferometers (LSIs) are efficient tools for optical analysis. They allow classical optical wave-front
aberrations measurements as well as the precise evaluation of abrupt steps. The basic element of an LSI
is the transmittance grating, which diffracts a number of orders (two in the case of a mono-dimensional LSI,
ideally three or four non coplanar orders in the case of bi-dimensional LSI). This brings the need for specifically
designed transmittance gratings. For instance, a mono-dimensional LSI needs a sinusoidal-shaped transmittance,
since its Fourier transform carries exactly 2 orders. Such transmittances are however either impossible or at least
extremely costly to design using classical macroscopic techniques, mainly because the usual thin film deposition
techniques require several technological steps, in order to get the desired light filtering effect.
Given these constraints, we made use of sub-wavelength structures in order to build a new class of LSI. They
are made of sub-wavelength lamellar metallic gratings specifically designed for the mid-infrared, and allow the
precise coding of the desired transmission shape all over the LSI grating.
The need for segmented wave front measurements has been rocketing for several years. The applications are
various: thickness of metallic masks, diffracting elements, phasing of the primary segmented mirrors of telescopes,
such as the Keck telescope, laser beam coherent recombination... Lateral shearing interferometers are common
wave front sensors, used with success to test classical optical components. This technique does not require a
reference wave, which is a major advantage. The lateral shearing interferometry has also proved successful to
analyze segmented wave front; results of such a measurement by a diffraction-grating based interferometer are
presented and analyzed. We dwell upon quadri-wave lateral shearing interferometers (QWLSI), which offer the
possibility to characterize two-dimensionally the wave front, in a single measurement. This technique combines
accuracy and qualities such as compactness and simplicity. Moreover, a chromatic regime of lateral shearing
interferometers based on diffraction grating can be pointed out; this allows a two-color analysis to greatly extend
the dynamic range. In the first parts we will present general considerations on QWLSI and segmented surface;
then a technique to increase the dynamic range is investigated both theoretically and experimentally.
Based on multi-lateral shearing interferometry, a powerful technique, called the Quadri-Wave Lateral Shearing Interferometer (QWLSI) is used to evaluate the wavefront in an accurate and precise way. Our device can be used for the characterization of complex and very aberrant optical devices, the control of optical components and also for laser beam evaluation. This communication will detail the response of the QWLSI and its metrological performances, such as its high resolution, its adjustable sensitivity and dynamic. It will then be focused on two innovative applications of the QWLSI. The first application concerns the evaluation of infrared lenses dedicated to high-performance cameras. We will present experimental results recently completed by our prototype dedicated to the LWIR domain (λ=8-14μm). In a second part, we will study the possibility to analyze wave-fronts with discontinuities. Such wave-fronts can be produced by segmented mirrors, diffractive components or also bundle of single-mode fibers. We will finally present simulation results for this latter application.
Subwavelength metallic structures are used to design gratings with a great variety of transmittance levels. Such gratings can answer growing needs for complex transmittance devices, particularly useful for wave-front analysis applications. Having in mind the conception of a perfectly sinusoidal transmittance for the mid-infrared, we have decided to test the ability of subwavelength lamellar gratings to code the transmittance with several levels. In order to calibrate gratings transmission, as a function of the fill factor, we have designed, realized and measured samples made of six 2mm x 2mm gratings, with transmittance ranging from 10% to 95%. Experimental results for TM- and TE-polarized light are reported and analysed.
Based on lateral shearing interferometry, a powerful technique, called the Quadri-Wave Lateral Shearing Interferometer (QWLSI), is used to evaluate the wave-front distortions with a high accuracy. Our device can be used for the characterization of complex and very aberrant optical devices, the testing of optical components, the control of adaptive optics and also for laser beam evaluation. The particular design of the QWLSI provides him interesting properties for wave-front metrology such as a high transverse resolution, a tunable sensitivity or also an evaluation of the measurement error. An innovative interferogram analysis allows also an increasing accuracy of the measurement. After dealing with these aspects, we will conclude by presenting an experimental wave-front analysis of a femtosecond laser pulse and an analysis in the far infrared spectral range [λ=8-14 μm].
A powerful and achromatic interferometric technique based on recent advances in the technology of non-diffracting arrays is used to evaluate wave-front distortions with a high transverse resolution and an easily tunable dynamic range. The device presented here belongs to the family of Multiple Wave Lateral Shearing Interferometers (MWLSI) and has the natural capability to measure simultaneously four wave-front derivatives. In this communication, we propose to exploit all the information de facto included in the interferogram; in this perspective we suggest a new method of reconstruction of the wave-front knowing its derivatives. We will show that our device is already successful in the field of laser metrology in the near infrared domain and that it is promising for the far infrared domain with the presentation of a prototype dedicated to measurements at 10.6µm.
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