Samuel Günther
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 April 2024 Paper
Jan Lehr, Martin Pape, Samuel Günther, Jörg Krüger
Proceedings Volume 13072, 1307217 (2024) https://doi.org/10.1117/12.3023184
KEYWORDS: Pollution, Machine learning, Industrial applications, Image segmentation, Pollution detection, Object recognition, Industry, Image processing, Databases, Defect inspection

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