Prof. Satoru Toyooka
at Saitama Univ
SPIE Involvement:
Author
Publications (29)

Proceedings Article | 18 June 2007 Paper
Proceedings Volume 6616, 66162R (2007) https://doi.org/10.1117/12.726094
KEYWORDS: Speckle pattern, Interferometry, Speckle, Ferroelectric materials, Data processing, Mirrors, Modulation, Phase shift keying, Fringe analysis, Image filtering

Proceedings Article | 15 September 2006 Paper
Proceedings Volume 6341, 634119 (2006) https://doi.org/10.1117/12.695360
KEYWORDS: Speckle, Interferometry, Ozone, Pollution, Speckle pattern, Wavefronts, Environmental monitoring, Beam splitters, Biomedical optics, Phase interferometry

Proceedings Article | 7 October 2005 Paper
Proceedings Volume 5947, 59470L (2005) https://doi.org/10.1117/12.622928
KEYWORDS: Phase shift keying, Phase modulation, Phase measurement, Phase contrast, Absorption, Liquid crystals, Diffraction, Imaging systems, Modulators, Phase shifting

Proceedings Article | 19 November 2003 Paper
Hirofumi Kadono, Genyoh Takahashi, Satoru Toyooka
Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.527504
KEYWORDS: Pollution, Speckle, Speckle pattern, Ozone, Eye, Veins, Environmental monitoring, Light scattering, Visualization, Environmental sensing

Proceedings Article | 27 May 2003 Paper
Proceedings Volume 4933, (2003) https://doi.org/10.1117/12.516631
KEYWORDS: Speckle, Signal processing, CCD cameras, Speckle pattern, Phase shift keying, Filtering (signal processing), Data processing, Spatial resolution, Image processing, Image filtering

Showing 5 of 29 publications
Conference Committee Involvement (2)
Optical Measurement Systems for Industrial Inspection
18 June 2007 | Munich, Germany
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
16 June 1999 | Yokohama, Japan
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