Sean Happel
at Johns Hopkins Univ Applied Physics Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 May 2014 Paper
Michele Lohr, Michael Thomas, Todd Neighoff, Daniel Prendergast, Austin Dress, Sean Happel, Karen Siegrist, Yale Chang
Proceedings Volume 9071, 90711C (2014) https://doi.org/10.1117/12.2050828
KEYWORDS: Cameras, 3D metrology, Long wavelength infrared, Infrared cameras, Pyrometry, Microbolometers, 3D modeling, 3D vision, Infrared imaging, Temperature metrology

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