Dr. Sergey Rumyantsev Profile

Dr. Sergey Rumyantsev

at Rensselaer Polytechnic Institute

SPIE Involvement:

Author

Proceedings Article | 7 October 2014 Paper

Frequency tunable photo-impedance sensor

Tanuj Saxena, Sergey Rumyantsev, Partha Dutta, Michael Shur

Proceedings Volume 9220, 92200N (2014) https://doi.org/10.1117/12.2062457

KEYWORDS: Capacitance, Sensors, Molybdenum, Resistance, Capacitors, Silicon, Semiconductors, Oxides, Metals, Doping

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Proceedings Article | 22 June 2007 Paper

Current and optical low-frequency noise of GaInN/GaN green light emitting diodes

Sergey Rumyantsev, Christian Wetzel, Michael Shur

Proceedings Volume 6600, 66000I (2007) https://doi.org/10.1117/12.724282

KEYWORDS: Light emitting diodes, Quantum wells, External quantum efficiency, Resistance, Quantum efficiency, Photodiodes, Resistors, Green light emitting diodes, Superposition, Ultraviolet radiation

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Proceedings Article | 22 June 2007 Paper

Generation-recombination noise in forward-biased 4H-SiC p-n diode

Sergey Rumyantsev, Alexander Dmitriev, Michael Levinshtein, Dmitri Veksler, Michael Shur, John Palmour, Mrinal Das, Brett Hull

Proceedings Volume 6600, 66001J (2007) https://doi.org/10.1117/12.723444

KEYWORDS: Diodes, Silicon carbide, Doping, Systems modeling, Diffusion, Transistors, Microwave radiation, Semiconductors, Data modeling, Resistors

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Proceedings Article | 23 May 2005 Paper

Low frequency noise of light emitting diodes

S. Rumyantsev, S. Sawyer, N. Pala, M. Shur, Yu. Bilenko, J. P. Zhang, X. Hu, A. Lunev, J. Deng, R. Gaska

Proceedings Volume 5844, (2005) https://doi.org/10.1117/12.608559

KEYWORDS: Light emitting diodes, Resistance, Lamps, Halogens, Signal to noise ratio, Light sources, Photodetectors, Ultraviolet radiation, Photodiodes, Interference (communication)

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Proceedings Article | 25 May 2004 Paper

1/f noise in GaN/AlGaN heterostructure field effect transistors under condition of strong geometric magnetoresistance

Sergey Rumyantsev, Michael Shur, Wojciech Knap, Nina Dyakonova, Fabien Pascal, Alain Hoffman, Y. Ghuel, C. Gaquiere, D. Theron

Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.546748

KEYWORDS: Magnetism, Resistance, Field effect transistors, Heterojunctions, Gallium nitride, Transistors, Aluminum nitride, Temperature metrology, Gallium arsenide, Metalorganic chemical vapor deposition

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Proceedings Article | 25 May 2004 Paper

Low frequency noise in 4H-SiC BJTs

Sergey Rumyantsev, Michael Levinshtein, Anant Agarwal, John Palmour

Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.546075

KEYWORDS: Silicon carbide, Resistance, Silicon, Transistors, Diodes, Oscillators, Microwave radiation, Optical communications, Telecommunications, Etching

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Proceedings Article | 11 June 2003 Paper

Nanostructures on flexible substrates

Michael Shur, Sergey Rumyantsev, R. Gaska

Proceedings Volume 5023, (2003) https://doi.org/10.1117/12.514636

KEYWORDS: Cadmium sulfide, Semiconductors, Resistance, Solar cells, Nanostructures, Ultraviolet radiation, Photovoltaics, Metals, Skin, Crystals

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Proceedings Article | 12 May 2003 Paper

Generation-recombination noise in GaN and GaN-based devices

Nezih Pala, Sergey Rumyantsev, Michael Shur, Michael Levinshtein, M. Asif Khan, Grigory Simin, Remis Gaska

Proceedings Volume 5113, (2003) https://doi.org/10.1117/12.488468

KEYWORDS: Gallium nitride, Field effect transistors, Heterojunctions, Thin films, Gallium, Aluminum, Diodes, Temperature metrology, Silicon, Photodetectors

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Proceedings Article | 29 April 2003 Paper

Low-frequency noise in GaN-based two-dimensional structures

Serguei Roumiantsev, Michael Shur

Proceedings Volume 5118, (2003) https://doi.org/10.1117/12.498864

KEYWORDS: Gallium nitride, Electrons, Transistors, Silicon, Resistance, Heterojunctions, Field effect transistors, Temperature metrology, Data modeling, Semiconductors

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