Multi-plate crystal cavities consisting of compound refractive lenses were prepared on silicon wafers by lithographic techniques. The crystallographic orientation of the crystal device is the same as that of the two-plate x-ray resonators reported (Phys. Rev. Lett. 94, 174801, 2005). X-ray (12 4 0) back diffraction from these monolithic silicon crystal devices showed interference fringes due to cavity resonance through the compound refractive lenses (CRL), but with less
pronounced amplitudes. The transmitted beam size through this device is reduced by a factor of 5. Detailed analysis on cavity interference and beam suppression are discussed.
Conference Committee Involvement (10)
Advances in X-Ray/EUV Optics and Components XII
8 August 2017 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XI
31 August 2016 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components X
11 August 2015 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components IX
19 August 2014 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components VIII
26 August 2013 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components VII
13 August 2012 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components VI
22 August 2011 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components V
2 August 2010 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components IV
3 August 2009 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components III
11 August 2008 | San Diego, California, United States
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