Prof. Stuart A. Solin Profile

Prof. Stuart A. Solin

at Washington Univ in St Louis

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Proceedings Article | 5 May 2010 Paper

EXX phenomena in macroscopic, microscopic, and nanoscopic structures

S. Solin

Proceedings Volume 7679, 76790B (2010) https://doi.org/10.1117/12.849887

KEYWORDS: Semiconductors, Metals, Resistance, Lead, Magnetism, Finite element methods, Interfaces, Solids, Sensors, Magnetic semiconductors

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The new "EXX" phenomena in macroscopic, microscopic and nanoscopic metal-semiconductor hybrid structures is described. Here E = extraordinary and XX = magnetoresistance (EMR), piezoconductance (EPC), optoconductance (EOC), and electroconductance (EEC). This new class of phenomena is based on the control and dominance of the geometric contributions, e.g. sample shape, lead placement, the presence of inhomogenieties, etc., to the transport properties of a physical system in contrast to traditional transport phenomena which are dominated by the intrinsic properties, e.g. mobility, carrier density, band structure, etc. The underlying phyiscs of EXX phenomena is elucidated with particular emphasis on the use of analytic and finite element analysis methods to quantitatively account for the observed EXX signal enhancement. The potential application of EXX phenomena to the study of the biologically relevant properties of cells such as surface charge density will be described.

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