Dr. Xiang Ding
at National Institute of Metrology
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 18 December 2019 Paper
Yanzhe Fu, Xiang Ding, Jiangchao Li, Jiyan Zhang
Proceedings Volume 11337, 113370B (2019) https://doi.org/10.1117/12.2542145
KEYWORDS: Raman spectroscopy, Silicon, Confocal microscopy, Microscopes, Spatial resolution, Polymethylmethacrylate, Point spread functions, Chromium, Coating, Polishing

Proceedings Article | 15 November 2018 Paper
Jiyan Zhang, Wenli Liu, Baoyu Hong, Lei Yang, Xiang Ding, Mingliang Gao
Proceedings Volume 10964, 1096420 (2018) https://doi.org/10.1117/12.2505554
KEYWORDS: Standards development, Cornea, Eye, Tolerancing, Eye models, Metrology, Calibration, Structural design, Reflection

Proceedings Article | 12 January 2018 Paper
Shihang Fu, Li Zhang, Yao Hu, Xiang Ding
Proceedings Volume 10620, 106201H (2018) https://doi.org/10.1117/12.2295207
KEYWORDS: Point spread functions, Raman spectroscopy, Confocal microscopy, Microscopy, Signal to noise ratio, Data modeling, Raman scattering, Light scattering, Statistical modeling, Computer simulations

Proceedings Article | 19 October 2016 Paper
Proceedings Volume 10155, 101551D (2016) https://doi.org/10.1117/12.2246234
KEYWORDS: Raman spectroscopy, Precision calibration, Calibration, Silicon

Proceedings Article | 15 October 2012 Paper
Fei Li, Lin Li, Xiang Ding, Wenli Liu
Proceedings Volume 8417, 84171N (2012) https://doi.org/10.1117/12.975924
KEYWORDS: Confocal microscopy, Error analysis, Mirrors, Standards development, Lenses, Sensors, Spherical lenses, Optical components, Calibration, Objectives

Showing 5 of 7 publications
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