Prof. Xiaohao Dong
at Shanghai Advanced Research Institute, Chinese Academy of Sciences
SPIE Involvement:
Conference Program Committee | Author
Publications (3)

Proceedings Article | 20 November 2024 Paper
Jiezhuo Wang, Guang Zhou, Weizheng Lei, Xiaohao Dong, Jie Wang
Proceedings Volume 13241, 1324117 (2024) https://doi.org/10.1117/12.3045125
KEYWORDS: Mirror surfaces, Sensors, Mirrors, Calibration, Optical surfaces, Motion measurement, X-rays, Interferometry, Optical testing

Proceedings Article | 13 November 2024 Paper
Wanjia Yin, Zengyan Zhang, Xiaohao Dong
Proceedings Volume 13280, 132800E (2024) https://doi.org/10.1117/12.3046293
KEYWORDS: X-rays, Lenses, Confocal microscopy, Diamond, Femtosecond phenomena, Laser ablation, X-ray microscopy, X-ray computed tomography, Point clouds, X-ray technology

Proceedings Article | 18 December 2023 Paper
Guang Zhou, Debo Yuan, Jiezhuo Wang, Weizheng Lei, Xiaohao Dong, Guobin Zhang, Jie Wang
Proceedings Volume 12968, 1296802 (2023) https://doi.org/10.1117/12.2692224
KEYWORDS: Mirrors, Mirror surfaces, X-rays, Fizeau interferometers, Optical path differences, Metrology, Error analysis, Synchrotron radiation, Deformable mirrors

Conference Committee Involvement (2)
Optical Metrology and Inspection for Industrial Applications XII
11 October 2025 | Beijing, China
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top