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Dr. Xuecheng Wei
at Institute of Semiconductors CAS
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Publications (1)
Proceedings Article | 4 January 2008 Paper
Characterization of bulk ZnO single crystal grown by a CVT method
Xuecheng Wei, Youwen Zhao, Zhiyuan Dong, Jinmin Li
Proceedings Volume 6841, 68410F (2008) https://doi.org/10.1117/12.759322
KEYWORDS: Zinc oxide, Crystals, Annealing, Single crystal X-ray diffraction, Zinc, Oxygen, X-ray diffraction, Spectroscopy, Diffraction, Mass spectrometry
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