Dr. Yan Chen
Research Scientist at Tokyo Electron America Inc
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Author
Publications (7)

Proceedings Article | 25 March 2008 Paper
Yan Chen, Masahiro Yamamoto, Dmitriy Likhachev, Gang He, Akihiro Sonoda, Vi Vuong
Proceedings Volume 6922, 69223R (2008) https://doi.org/10.1117/12.773133
KEYWORDS: Scatterometry, Critical dimension metrology, Dielectrics, Semiconducting wafers, Refractive index, Optical properties, Scatter measurement, Data modeling, Semiconductor manufacturing, Process modeling

Proceedings Article | 5 April 2007 Paper
Proceedings Volume 6518, 65183C (2007) https://doi.org/10.1117/12.713341
KEYWORDS: Metrology, Semiconducting wafers, Critical dimension metrology, Lithography, Thin films, Scanning electron microscopy, Process control, Deposition processes, Roentgenium, Error analysis

Proceedings Article | 13 April 2005 Paper
Proceedings Volume 5733, (2005) https://doi.org/10.1117/12.592031
KEYWORDS: Nonlinear optics, Refractive index, Phase shifts, Photonic crystals, Thin films, Bistability, Crystals, Mirrors, Nonlinear crystals, Transmittance

Proceedings Article | 21 June 2002 Paper
Proceedings Volume 4626, (2002) https://doi.org/10.1117/12.472106
KEYWORDS: Microfluidics, Luminescence, Waveguides, Biosensing, Optical microcavities, Sensors, Biological research, Integrated optics, Fluorescence spectroscopy, Optical lithography

Proceedings Article | 6 June 2002 Paper
Proceedings Volume 4629, (2002) https://doi.org/10.1117/12.469496
KEYWORDS: Resonators, Phase shifts, Phase shifting, Resonance enhancement, Nonlinear optics, Absorption, Nonlinear response, Signal attenuation, Refractive index, Optical components

Showing 5 of 7 publications
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