Yannan Yin
at Institute of Science Tokyo
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 March 2014 Paper
Proceedings Volume 9033, 90334M (2014) https://doi.org/10.1117/12.2043219
KEYWORDS: X-ray computed tomography, Sensors, Positron emission tomography, Image quality, Reconstruction algorithms, Image quality standards, Image restoration, Image processing, Scanners, X-ray sources

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