Dr. Yannick Bourgin
at Technische Univ Ilmenau
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 14 September 2018 Presentation + Paper
Yannick Bourgin, Falk Nagel, Patrick Feßer, Jean-Pierre Bergmann, Stefan Sinzinger
Proceedings Volume 10744, 107440X (2018) https://doi.org/10.1117/12.2320579
KEYWORDS: Diffractive optical elements, Computer generated holography, High power lasers, Metals, Gas lasers, Lithography, Laser welding, Diffusers, Semiconductor lasers, Etching

Proceedings Article | 20 October 2016 Paper
T. Weichelt, Y. Bourgin, M. Banasch, U. Zeitner
Proceedings Volume 10032, 1003204 (2016) https://doi.org/10.1117/12.2248545
KEYWORDS: Photomasks, Electron beam lithography, Polarizers, Lithography, Diffraction, Vestigial sideband modulation, Photoresist materials, Beam shaping, Semiconducting wafers, Scanning electron microscopy

Proceedings Article | 21 April 2016 Paper
Proceedings Volume 9884, 98842I (2016) https://doi.org/10.1117/12.2227129
KEYWORDS: Photomasks, Plasmonics, Lithography, Nanolithography, Semiconducting wafers, Reflection, Gold, Nanostructures, Chromium, Apertures, Polymers, Absorption, Polarization, Lithographic illumination, Glasses

Proceedings Article | 15 March 2016 Paper
Uwe Zeitner, Tina Weichelt, Yannick Bourgin, Robert Kinder
Proceedings Volume 9780, 97800R (2016) https://doi.org/10.1117/12.2222028
KEYWORDS: Lithography, Photomasks, Diffraction, Fabrication, Vestigial sideband modulation, 3D scanning, Computing systems, Micro optics, Optical resolution, Beam shaping, Electron beam lithography, Binary data, Printing, Optical components

Proceedings Article | 15 March 2016 Paper
Yannick Bourgin, Daniel Voigt, Thomas Käsebier, Ernst-Bernhard Kley, Uwe Zeitner
Proceedings Volume 9780, 978014 (2016) https://doi.org/10.1117/12.2218610
KEYWORDS: Lithography, Metals, Photomasks, Polymers, Electron beam lithography, Double patterning technology, Diffraction gratings, Aluminum, Optical components, Optical lithography, Photoresist materials, Nanolithography, Coating, Scanning electron microscopy

Showing 5 of 8 publications
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