Prof. Yasuhiro Mizutani
Associate Professor at Osaka Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (37)

Proceedings Article | 1 January 2025 Paper
Proceedings Volume 13487, 134870R (2025) https://doi.org/10.1117/12.3051659
KEYWORDS: Ellipsometry, Reflection, Interfaces, Refractive index, Polarization, Polarizers, Optical surfaces, Optical properties, Windows, Silica

Proceedings Article | 13 March 2024 Presentation + Paper
Mona Yadi, Tsutomu Uenohara, Yasuhiro Mizutani, Yoshiharu Morimoto, Yasuhiro Takaya
Proceedings Volume 12858, 1285803 (2024) https://doi.org/10.1117/12.3002171
KEYWORDS: Vibration, Sensors, Pulse signals, Quartz, Microscopes, Microelectromechanical systems, Etching, Mode shapes, Statistical analysis, Image resolution, Remote sensing, Structural dynamics

Proceedings Article | 13 March 2024 Presentation + Paper
Proceedings Volume 12903, 129030F (2024) https://doi.org/10.1117/12.3002270
KEYWORDS: Signal to noise ratio, Signal detection, Machine learning, Sensors, Measurement uncertainty, Spatial resolution, Signal intensity, Image quality, Defect detection, Scattered light

Proceedings Article | 20 September 2023 Paper
Proceedings Volume 12607, 126070P (2023) https://doi.org/10.1117/12.3005557
KEYWORDS: Signal to noise ratio, Deep learning, Light sources and illumination, Measurement uncertainty, Image restoration, Defect inspection, Feature extraction, Error analysis, Education and training, Statistical methods

Proceedings Article | 8 December 2022 Paper
Proceedings Volume 12480, 124800D (2022) https://doi.org/10.1117/12.2660170
KEYWORDS: Silver, Metals, Nanostructures, Photoresist materials, Nanolithography, Diffraction gratings, Diffraction, Scanning electron microscopy, Refractive index, Particles

Proceedings Article | 8 December 2022 Paper
Proceedings Volume 12480, 124800C (2022) https://doi.org/10.1117/12.2660169
KEYWORDS: Ellipsometry, Surface roughness, Polarization, Refractive index, Optical testing, Neodymium, Polarizers, Scanning electron microscopy, Reflection, Ranging

Proceedings Article | 27 October 2021 Paper
Proceedings Volume 11927, 1192708 (2021) https://doi.org/10.1117/12.2616249
KEYWORDS: Lithography, Holograms, Image filtering, Convolution, Structural design, Photoresist materials, Modulation, Finite-difference time-domain method, Optical design, 3D image reconstruction

Proceedings Article | 27 October 2021 Paper
Proceedings Volume 11927, 1192703 (2021) https://doi.org/10.1117/12.2616228
KEYWORDS: Convolutional neural networks, Signal to noise ratio, Defect inspection, Time metrology, Statistical analysis, Light scattering, Correlation function, Projection systems, Inspection, Sensors

Proceedings Article | 27 October 2021 Paper
Proceedings Volume 11925, 119250R (2021) https://doi.org/10.1117/12.2615673
KEYWORDS: Signal detection, Luminescence, Image quality, Sensors, Machine learning, CMOS sensors, CCD image sensors, Raster graphics, Photon counting, Photodetectors

Proceedings Article | 15 June 2020 Paper
Proceedings Volume 11521, 115210E (2020) https://doi.org/10.1117/12.2573239
KEYWORDS: Signal detection, Machine learning, Sensors, Luminescence, Convolutional neural networks, Photodetectors, Molecules, Convolution, Image quality, Mechanical engineering

Proceedings Article | 1 March 2019 Paper
M. Yamagiwa, T. Minamikawa, C. Trovato, T. Ogawa, D. G. Ibrahim, Y. Kawahito, R. Oe, K. Shibuya, T. Mizuno, E. Abraham, Y. Mizutani, T. Iwata, H. Yamamoto, K. Minoshima, T. Yasui
Proceedings Volume 10944, 1094414 (2019) https://doi.org/10.1117/12.2509354
KEYWORDS: Beam splitters, 3D image processing, Image resolution, Rubidium, Continuous wave operation, Polarization

Proceedings Article | 24 April 2018 Paper
Proceedings Volume 10711, 107111O (2018) https://doi.org/10.1117/12.2318671
KEYWORDS: Confocal microscopy, Objectives, Spatial resolution, Spectroscopy, Biomedical optics, Image acquisition, Imaging systems

Proceedings Article | 24 April 2018 Paper
Proceedings Volume 10711, 1071120 (2018) https://doi.org/10.1117/12.2317029
KEYWORDS: Confocal microscopy, Microscopy, Phase imaging, Optical microscopy, Spectroscopy, Frequency combs

Proceedings Article | 20 February 2018 Paper
Proceedings Volume 10505, 105050Y (2018) https://doi.org/10.1117/12.2288709
KEYWORDS: Imaging spectroscopy, Hyperspectral imaging, Spectroscopy, Chromium, Coating, Sensors, Spatial resolution, Fabry–Perot interferometers, Spectral resolution, Polarization

Proceedings Article | 22 February 2017 Paper
Kyuki Shibuya, Takeo Minamikawa, Yasuhiro Mizutani, Takeshi Yasui, Tetsuo Iwata
Proceedings Volume 10076, 100761C (2017) https://doi.org/10.1117/12.2251250
KEYWORDS: Terahertz radiation, Spectral resolution, Signal detection

Proceedings Article | 24 November 2016 Paper
Proceedings Volume 10023, 1002316 (2016) https://doi.org/10.1117/12.2248360
KEYWORDS: Optical spheres, Metrology, Optical testing, Diffraction gratings, Signal detection, Imaging systems, Optical components, CMOS cameras, Optical tweezers, Objectives

Proceedings Article | 24 November 2016 Paper
Proceedings Volume 10023, 100230N (2016) https://doi.org/10.1117/12.2247667
KEYWORDS: Dielectrics, Carbon nanotubes, Dichroic materials, Absorption, CMOS cameras, Prisms, CMOS sensors, Silicon, Polarizers, Sensors

Proceedings Article | 31 October 2016 Paper
Yasuhiro Mizutani, Kyuki Shibuya, Hiroki Taguchi, Tetsuo Iwata, Yasuhiro Takaya, Takeshi Yasui
Proceedings Volume 10021, 100210B (2016) https://doi.org/10.1117/12.2246311
KEYWORDS: Hyperspectral imaging, Frequency combs, Image processing, Fiber lasers, Signal detection, Sensors, Spatial light modulators, Modulation, Imaging systems, Erbium

Proceedings Article | 28 August 2016 Paper
Nabila Makhtar, Quang Duc Pham, Yasuhiro Mizutani, Yoshio Hayasaki
Proceedings Volume 9960, 996016 (2016) https://doi.org/10.1117/12.2237482
KEYWORDS: Frequency combs, Cameras, Digital micromirror devices, Laser optics, Phase imaging, Frequency combs, Imaging systems, Spatial light modulators, Signal detection, Modulation, Signal generators

Proceedings Article | 8 October 2014 Paper
Kyuki Shibuya, Katsuhiro Nakae, Yasuhiro Mizutani, Tetsuo Iwata
Proceedings Volume 9225, 922505 (2014) https://doi.org/10.1117/12.2061711
KEYWORDS: Signal to noise ratio, Microscopy, Visibility, Spatial resolution, Sensors, Imaging systems, Speckle pattern, Image processing, Objectives, Light scattering

Proceedings Article | 6 August 2014 Paper
Proceedings Volume 9232, 92320M (2014) https://doi.org/10.1117/12.2064022
KEYWORDS: Nanoparticles, Photothermal effect, Interferometers, Phase shifts, Metals, Chemical elements, Refractive index, Fourier transforms, Gold, CMOS cameras

Proceedings Article | 5 May 2012 Paper
Proceedings Volume 8430, 84300Y (2012) https://doi.org/10.1117/12.922879
KEYWORDS: Optical tweezers, Silicon, Polarization, Nanoparticles, Interfaces, Polarizers, Phase measurement, Numerical analysis, Particles, Diffraction

Proceedings Article | 30 September 2011 Paper
Tetsuo Iwata, Yusuke Wada, Kentaro Nishigaki, Yasuhiro Mizutani
Proceedings Volume 8169, 816913 (2011) https://doi.org/10.1117/12.896767
KEYWORDS: Dielectrics, Gold, Metals, Fringe analysis, Reflectivity, Prisms, Interfaces, Numerical simulations, Ellipsometry, Titanium dioxide

Proceedings Article | 27 May 2011 Paper
Yasuhiro Mizutani, Takayuki Higuchi, Tetsuo Iwata, Yukitoshi Otani
Proceedings Volume 8082, 80823J (2011) https://doi.org/10.1117/12.889464
KEYWORDS: Interferometers, Oscillators, Ultrasonics, Prisms, Pulsed laser operation, Fringe analysis, Light sources, Reflectivity, Phase shifts, Vibrometry

Proceedings Article | 23 May 2011 Paper
Mizue Ebisawa, Satoru Hashimoto, Teruyoshi Hirano, Shuichi Maeda, Toshihide Iwanaga, Yasuhiro Mizutani
Proceedings Volume 8083, 80830V (2011) https://doi.org/10.1117/12.889301
KEYWORDS: Silver, Reflectivity, Electrons, Metals, Nanoparticles, Chemical species, Particles, Scattering, Scanning electron microscopy, Motion models

Proceedings Article | 11 November 2010 Paper
Proceedings Volume 7855, 78550N (2010) https://doi.org/10.1117/12.871749
KEYWORDS: Interferometers, Oscillators, Ultrasonics, Pulsed laser operation, Reflectivity, Prisms, Modulation, Electrodes, Signal generators, Semiconductor lasers

Proceedings Article | 3 August 2010 Paper
Yukitoshi Otani, Fumio Kobayashi, Yasuhiro Mizutani, Shuugo Watanabe, Manabu Harada, Toru Yoshizawa
Proceedings Volume 7790, 77900A (2010) https://doi.org/10.1117/12.861561
KEYWORDS: 3D metrology, Liquid crystals, Distance measurement, Phase shifting, CCD cameras, Microscopes, Lens design, Bessel functions, Phase shifts, Calibration

Proceedings Article | 10 September 2009 Paper
Proceedings Volume 7432, 743210 (2009) https://doi.org/10.1117/12.827028
KEYWORDS: Liquid crystals, 3D metrology, Phase shifting, Distance measurement, Phase shifts, Liquids, Optics manufacturing, Microscopes, Liquid lenses, Bessel functions

Proceedings Article | 17 November 2008 Paper
Proceedings Volume 7266, 72660D (2008) https://doi.org/10.1117/12.817388
KEYWORDS: Ferroelectric polymers, Actuators, Silver, Optical actuators, Electrodes, Piezoelectric effects, Laser irradiation, Optical fibers, Radio optics, Pollution control

Proceedings Article | 11 August 2008 Paper
Yukitoshi Otani, Tomohito Kuwagaito, Yasuhiro Mizutani
Proceedings Volume 7063, 70630Y (2008) https://doi.org/10.1117/12.798143
KEYWORDS: Nanostructures, Polarimetry, Polarization, Wave plates, Scatterometry, Polarizers, Statistical analysis, Dielectric polarization, Silica, Picosecond phenomena

Proceedings Article | 25 October 2006 Paper
Y. Mizutani, S. Nishimura, Y. Otani, N. Umeda
Proceedings Volume 6374, 637404 (2006) https://doi.org/10.1117/12.687505
KEYWORDS: Ferroelectric polymers, Actuators, Laser irradiation, Silver, Piezoelectric effects, Coating, Photography, Photothermal effect, Helium neon lasers, Polymer thin films

Proceedings Article | 19 October 2006 Paper
Proceedings Volume 6374, 63740N (2006) https://doi.org/10.1117/12.689277
KEYWORDS: Optical fibers, Photothermal effect, Actuators, Optical actuators, Particles, Glasses, Finite element methods, 3D applications, Magnetism, 3D metrology

Proceedings Article | 19 October 2006 Paper
Proceedings Volume 6374, 63740I (2006) https://doi.org/10.1117/12.689330
KEYWORDS: Actuators, Liquids, Liquid lenses, Polymer thin films, Polymers, Time metrology, Polymeric actuators, Control systems, Charge-coupled devices, Mechanical engineering

Proceedings Article | 19 October 2006 Paper
Proceedings Volume 6374, 637405 (2006) https://doi.org/10.1117/12.687513
KEYWORDS: Magnetism, Actuators, Neodymium, Photography, Motion controllers, Photothermal effect, Motion analysis, Pollution control, Control systems, Light sources

Proceedings Article | 7 November 2005 Paper
Proceedings Volume 6000, 60000J (2005) https://doi.org/10.1117/12.633147
KEYWORDS: Liquids, Liquid lenses, Liquid crystals, Phase shifts, Phase shifting, 3D metrology, Inspection, Mirrors, Distance measurement, Sensors

Proceedings Article | 20 January 2005 Paper
Proceedings Volume 5633, (2005) https://doi.org/10.1117/12.577047
KEYWORDS: Prisms, Transmittance, Interferometers, Refractive index, Antireflective coatings, Reflectivity, Silicon, Manufacturing, Semiconducting wafers, Eye

Proceedings Article | 25 October 2004 Paper
Proceedings Volume 5602, (2004) https://doi.org/10.1117/12.575373
KEYWORDS: Actuators, Optical actuators, Magnetism, Laser optics, Photothermal effect, Semiconductor lasers, Opto mechatronics, Light sources and illumination, Temperature metrology, Optical simulations

Showing 5 of 37 publications
Conference Committee Involvement (14)
Optical Technology and Measurement for Industrial Applications Conference
21 April 2025 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Optical Technology and Measurement for Industrial Applications Conference 2022
18 April 2022 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications VIII
11 October 2021 | Nantong, JS, China
Optical Technology and Measurement for Industrial Applications Conference
20 April 2021 | Online, Japan
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Showing 5 of 14 Conference Committees
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