Yi Zhang
at Huazhong Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 March 2013 Paper
Futao Pi, Yi Zhang, Gang Lu, Baochuan Pang
Proceedings Volume 8783, 878309 (2013) https://doi.org/10.1117/12.2012432
KEYWORDS: Microscopy, Statistical analysis, Edge detection, Error analysis, Edge roughness, Image analysis, Microscopes, Electronics, Electronics engineering, Machine vision

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