Dr. Yingming Xu
at Shanghai Institute of Optics & Fine Mechanics
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 15 December 2022 Paper
Proceedings Volume 12478, 124784F (2022) https://doi.org/10.1117/12.2654953
KEYWORDS: Refractive index, Diagnostics, Ultrafast phenomena, Kerr effect, Charge-coupled devices, Time metrology, Signal detection, Plasma, Picosecond phenomena, Oscilloscopes

Proceedings Article | 28 February 2021 Paper
Proceedings Volume 11781, 117811P (2021) https://doi.org/10.1117/12.2591441

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