Yongyu Wu
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 December 2024 Paper
Proceedings Volume 13423, 1342306 (2024) https://doi.org/10.1117/12.3052326
KEYWORDS: Lithography, Semiconductors, Integrated circuits, Education and training, Optical proximity correction, Electronic design automation

Proceedings Article | 10 December 2024 Paper
Yongyu Wu, Miaohong Yao, Shibin Xu, Kun Ren, Dawei Gao, Xiaoci Li, Ken Chen, Qijian Wan, Chunshan Du
Proceedings Volume 13423, 1342308 (2024) https://doi.org/10.1117/12.3052330
KEYWORDS: Scanning electron microscopy, Contour extraction, Design, Transistors, Image processing, Critical dimension metrology, Electronic design automation

Proceedings Article | 10 December 2024 Paper
Xinyuan Zhang, Miaohong Yao, Shibin Xu, Zheju Yan, Kun Ren, Yongyu Wu, Dawei Gao, Ken Chen, Xiangshang Zhu, Chenwei Sun, Feng Shao
Proceedings Volume 13423, 134230E (2024) https://doi.org/10.1117/12.3052691
KEYWORDS: Data modeling, Optical proximity correction, Scanning electron microscopy, Performance modeling, Contour extraction, Semiconducting wafers, Image processing, Critical dimension metrology, Modeling

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