Yuemin Wang
at Hebei Univ of Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 October 2020 Presentation + Paper
Proceedings Volume 11552, 115520Z (2020) https://doi.org/10.1117/12.2572962
KEYWORDS: 3D metrology, Deflectometry, Imaging systems, 3D acquisition, Infrared imaging, Light, Complex systems, Reflectivity, Data processing, Reflection

Proceedings Article | 18 November 2019 Paper
Proceedings Volume 11189, 111890Q (2019) https://doi.org/10.1117/12.2537295
KEYWORDS: 3D imaging metrology, Specular reflections, Cameras, LCDs, 3D metrology, Deflectometry, Fringe analysis, Mirrors, Calibration, 3D acquisition, Manufacturing, Reflection

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