Prof. Zhao-Wei Zhong Profile

Prof. Zhao-Wei Zhong

at Nanyang Technological Univ

SPIE Involvement:

Author

Publications (24)

Proceedings Article | 24 October 2016 Paper

Visual signature reduction of unmanned aerial vehicles

Z. W. Zhong, Z. X. Ma, Jayawijayaningtiyas, J. H. H. Ngoh

Proceedings Volume 9997, 999707 (2016) https://doi.org/10.1117/12.2241967

KEYWORDS: Unmanned aerial vehicles, Visualization, Camouflage, Prototyping, Software development, Defense and security, Visibility, Polymers, Cameras, Adaptive control

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Proceedings Article | 21 October 2016 Paper

Studies of air traffic forecasts, airspace load and the effect of ADS-B via satellites on flight times

Z. W. Zhong, Saiful Ridhwan Salleh, W. X. Chow, Z. M. Ong

Proceedings Volume 9991, 99910B (2016) https://doi.org/10.1117/12.2241978

KEYWORDS: Satellites, Satellite navigation systems, Data modeling, Data archive systems, Aerospace engineering, Modeling and simulation, Air contamination, Gases, Nitrous oxide, Carbon dioxide

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Proceedings Article | 17 July 2015 Paper

Improvement of the pad wear shape in fixed abrasive chemical-mechanical polishing for manufacturing optical components

N. Y. Nguyen, Y. B. Tian, Z. W. Zhong

Proceedings Volume 9524, 95240F (2015) https://doi.org/10.1117/12.2185971

KEYWORDS: Surface finishing, Abrasives, Chemical mechanical planarization, Kinematics, Optics manufacturing, Polishing, Optical components, Aerospace engineering, Chemical analysis, Shape analysis

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Proceedings Article | 17 June 2009 Paper

Sensing performance of a Shack Hartmann wavefront sensor versus the properties of the light beam

L. Zhao, W. Guo, X. Li, Z. Zhong

Proceedings Volume 7390, 73900E (2009) https://doi.org/10.1117/12.827327

KEYWORDS: Wavefront sensors, Wavefronts, Charge-coupled devices, Sensors, Spherical lenses, Optical simulations, Refractive index, MATLAB, Sensing systems, Computer simulations

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Proceedings Article | 30 December 2008 Paper

Investigation of the performance of micro-thermoelectric coolers

Z. W. Zhong, W. Fan, C. W. Low

Proceedings Volume 7269, 72690V (2008) https://doi.org/10.1117/12.808068

KEYWORDS: Convection, Semiconducting wafers, Copper, Temperature metrology, Technetium, Tantalum, Thermal effects, Ceramics, Aerospace engineering, Chemical elements

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Proceedings Article | 3 October 2008 Paper

Investigation of light scattering for scratch detection

Z. W. Zhong, L. P. Zhao, L. J. Wang

Proceedings Volume 7155, 71552W (2008) https://doi.org/10.1117/12.814606

KEYWORDS: Light scattering, Polarization, Polarizers, Optical testing, Scatter measurement, Defect detection, Laser scattering, Scattering, Sensors, Optics manufacturing

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Proceedings Article | 3 October 2008 Paper

The interaction performance of white light, laser diode, and He-Ne laser with two wavefront sensing systems

Z. W. Zhong, L. P. Zhao, A. A. Hein

Proceedings Volume 7155, 71552X (2008) https://doi.org/10.1117/12.814607

KEYWORDS: Sensing systems, Light sources, Helium neon lasers, Semiconductor lasers, Wavefront sensors, CCD cameras, Image processing, Light, CMOS cameras, Wavefronts

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Proceedings Article | 7 March 2006 Paper

AFM scanning moire method for nanodeformation measurement

Huimin Xie, Gin Chai, Anand Asundi, Jin Yu, Yunguang Lu, Bryan Ngoi, Zhaowei Zhong, Satoshi Kishimoto

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498437

KEYWORDS: Moire patterns, Mica, Atomic force microscopy, Picosecond phenomena, Adhesives, YAG lasers, Nd:YAG lasers, CRTs, Mechanical engineering, Product engineering

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Proceedings Article | 12 April 2005 Paper

Design of micro robots with microgrippers for manipulation of micro-parts

Siew Kuan Nah, Zhaowei Zhong

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621681

KEYWORDS: Actuators, Finite element methods, Robots, Solid modeling, Computer aided design, Chemical elements, Glasses, Mechanics, Adhesives, Experimental mechanics

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Proceedings Article | 12 April 2005 Paper

Finite element study of flip chip on board in drop test

Siew Kuan Nah, Zhaowei Zhong

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621927

KEYWORDS: Finite element methods, Epoxies, Reliability, Visual process modeling, Visualization, 3D modeling, Analytical research, Silicon, Electronic components, Telecommunications

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Proceedings Article | 10 September 2004 Paper

Simulation of the effect of adhesion and cross-sectional nonuniformity of coatings on the thermal tuning of fiber Bragg gratings

Jinu Paul, Liping Zhao, B.K.A. Ngoi, Zhong Ping Fang, Toh Yong, Zhaowei Zhong

Proceedings Volume 5465, (2004) https://doi.org/10.1117/12.545575

KEYWORDS: Fiber Bragg gratings, Optical coatings, Polymers, Optical fibers, Thermal effects, Finite element methods, 3D modeling, Silicon, Temperature metrology, Fiber coatings

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Proceedings Article | 25 March 2003 Paper

Thermal strain analysis for flip chip packaging

Zhao Wei Zhong, S. Lee

Proceedings Volume 4945, (2003) https://doi.org/10.1117/12.469030

KEYWORDS: Epoxies, Finite element methods, Packaging, Silicon, Strain analysis, Thermal modeling, Manufacturing, Reliability, Design for manufacturability, Integrated modeling

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Proceedings Article | 25 March 2003 Paper

Calibration of a 2D piezoresistive stress sensor in (100) silicon using a 4PB fixture

Zhao Wei Zhong, B. Sim, Xiaowu Zhang

Proceedings Volume 4945, (2003) https://doi.org/10.1117/12.468424

KEYWORDS: Resistance, Sensors, Silicon, Calibration, Temperature metrology, Doping, Semiconducting wafers, Protactinium, Error analysis, Microelectronics

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Proceedings Article | 25 March 2003 Paper

Investigation of interfacial behavior of a Si-epoxy-FR4 structure under thermal testing using moiré interferometry

Zhao Wei Zhong, K. Wong, X. Shi, Z. Wang

Proceedings Volume 4945, (2003) https://doi.org/10.1117/12.468423

KEYWORDS: Interfaces, Silicon, Deflectometry, Epoxies, Fringe analysis, Diffraction gratings, Packaging, Mechanics, Manufacturing, Laser interferometry

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Proceedings Article | 17 February 2003 Paper

Application of moire interferometry to thermal strain analysis for electronics packaging

Zhaowei Zhong

Proceedings Volume 4833, (2003) https://doi.org/10.1117/12.474040

KEYWORDS: Electronics, Atomic force microscopy, Deflectometry, Strain analysis, Packaging, Silicon, Moire patterns, Fringe analysis, Diffraction gratings, Interfaces

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Proceedings Article | 17 February 2003 Paper

Surface texture characterization using a chroma meter

Zhaowei Zhong

Proceedings Volume 4833, (2003) https://doi.org/10.1117/12.474041

KEYWORDS: Surface roughness, Radium, Silicon carbide, Silicon, Surface finishing, Aluminum, Polishing, Metals, Reflection, Measurement devices

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Proceedings Article | 26 November 2001 Paper

Phase-shifting AFM moire method

Anand Asundi, Huimin Xie, Jin Yu, Zhaowei Zhong

Proceedings Volume 4448, (2001) https://doi.org/10.1117/12.449366

KEYWORDS: Atomic force microscopy, Phase shifting, Phase shifts, Phase measurement, Scanners, Ferroelectric materials, Moire patterns, Holography, Fringe analysis, Sensors

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Proceedings Article | 30 October 2001 Paper

Surface profile measurement using a CD optical pickup head

Zhaowei Zhong, W. Tham

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447370

KEYWORDS: Head, Sensors, Semiconductor lasers, Diffraction, Reflectivity, Beam splitters, Light, Objectives, Laser development, Compact discs

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Proceedings Article | 30 October 2001 Paper

Micro-moire for thermal deformation investigation in electronics packaging

Zhaowei Zhong, S. Lim, Anand Asundi, Tai Chai

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447350

KEYWORDS: Tin, Silver, Deflectometry, Copper, Electronics, Diffraction gratings, Fringe analysis, Packaging, Interferometers, Microelectronics

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Proceedings Article | 23 October 2001 Paper

Study of parameters affecting the sensitivity of a 3D measurement system using the phase shifting technique

Zhaowei Zhong, Chew Han, Anand Asundi

Proceedings Volume 4398, (2001) https://doi.org/10.1117/12.445561

KEYWORDS: Projection systems, Cameras, Phase shifting, 3D metrology, Calibration, Image processing, Image acquisition, Imaging systems, LCDs, MATLAB

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Proceedings Article | 23 October 2001 Paper

Study of relationships between roughness and lightness of precision-machined surfaces

Zhaowei Zhong, SweeHock Yeo, Liu Tay

Proceedings Volume 4398, (2001) https://doi.org/10.1117/12.445542

KEYWORDS: Surface roughness, Radium, Aluminum, Surface finishing, Polishing, Metals, Inspection, Reflectivity, Control systems, Manufacturing

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Proceedings Article | 13 June 2001 Paper

Thermal deformation measurement of electronic packaging component using AFM scanning moire method

Huimin Xie, Gin Chai, Anand Asundi, Yu Jin, Yunguang Lu, Bryan Ngoi, Zhaowei Zhong

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429567

KEYWORDS: Moire patterns, Electronic components, Packaging, Atomic force microscopy, Picosecond phenomena, Scanners, Microelectromechanical systems, Holography, Sensors, Mechanical engineering

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Proceedings Article | 23 October 2000 Paper

Measurement of thermal deformation of IC packages using the AFM scanning moire technique

Zhaowei Zhong, Yunguang Lu, Huimin Xie, Bryan Ngoi, Jin Yu, Gin Chai, Anand Asundi

Proceedings Volume 4229, (2000) https://doi.org/10.1117/12.404871

KEYWORDS: Moire patterns, Diffraction gratings, Atomic force microscopy, Fringe analysis, CCD cameras, Raster graphics, Scanners, Scanning electron microscopy, Spatial resolution, Microelectronics

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Proceedings Article | 23 October 2000 Paper

Finite element analysis and experiments of ultrafine-pitch wire bonding

Zhaowei Zhong, Kay Goh

Proceedings Volume 4229, (2000) https://doi.org/10.1117/12.404885

KEYWORDS: Capillaries, Finite element methods, Gold, Transducers, Tolerancing, Model-based design, Ultrasonics, Packaging, Laser bonding, Contamination

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Showing 5 of 24 publications

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