Dr. David Fuard
at LTM CNRS
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 13 May 2013 Paper
David Fuard, Nicolas Troscompt, Ismael El Kalyoubi, Sébastien Soulan, Maxime Besacier
Proceedings Volume 8789, 878919 (2013) https://doi.org/10.1117/12.2020674
KEYWORDS: Scatterometry, Optimization (mathematics), Inverse problems, Refractive index, Neural networks, Metrology, Lithography, Diffraction, Process control, Data modeling

Proceedings Article | 2 April 2010 Paper
Proceedings Volume 7638, 76381Y (2010) https://doi.org/10.1117/12.848309
KEYWORDS: Scanning electron microscopy, Optical proximity correction, Metrology, Calibration, Data modeling, Inspection, Process control, Optical lithography, Current controlled current source, Atomic force microscopy

Proceedings Article | 24 March 2009 Paper
Proceedings Volume 7272, 72723S (2009) https://doi.org/10.1117/12.814118
KEYWORDS: Thin films, Refractive index, Metrology, Inspection, Process control, Optical lithography, Current controlled current source, Spectroscopy, Polymer thin films, Polymers

Proceedings Article | 23 March 2009 Paper
Proceedings Volume 7272, 72721G (2009) https://doi.org/10.1117/12.812955
KEYWORDS: Mahalanobis distance, Critical dimension metrology, Optical proximity correction, Calibration, Fuzzy logic, Data modeling, Reliability, Scanning electron microscopy, Lithography, Optics manufacturing

Proceedings Article | 28 May 2004 Paper
Proceedings Volume 5377, (2004) https://doi.org/10.1117/12.533764
KEYWORDS: Lithography, 193nm lithography, Photomasks, Lithographic illumination, Critical dimension metrology, Data modeling, Binary data, Photoresist processing, Phase shifts, Optical proximity correction

Showing 5 of 7 publications
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