Presentation + Paper
11 January 2023 Towards integrated position sensors with nanometer precision
Sebastian A. Schulz, Paul Beck, Laura C. Wynne, Simone Iadanza, Liam O'Faolain, Peter Banzer
Author Affiliations +
Abstract
The ability to precisely measure the displacement between two elements, e.g. a mask and a substrate or a beam and optical elements, is fundamental to many precision experiments and processes. Yet typical optical displacement sensors struggle to go significantly below the diffraction limit. Here we combine advances in our understanding of directional scattering from nanoparticles with silicon photonic waveguides to demonstrate a displacement sensor with deep subwavelength accuracy. Depending on the level of integration and waveguide geometry used we achieve a spatial resolution between 5 − 7 nm, equivalent to approximately λ/200 − λ/300.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sebastian A. Schulz, Paul Beck, Laura C. Wynne, Simone Iadanza, Liam O'Faolain, and Peter Banzer "Towards integrated position sensors with nanometer precision", Proc. SPIE 12334, Emerging Applications in Silicon Photonics III, 1233405 (11 January 2023); https://doi.org/10.1117/12.2644959
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KEYWORDS
Waveguides

Sensors

Nanoparticles

Scattering

Silicon

Laser scattering

Light scattering

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