Paper
19 November 1993 Two-dimensional photodetector with the light-controlled area of photosensitivity
Andrei V. Kichaev, Peter G. Kasherininov, Sergey Yu. Kuzmin, Aleksey V. Klementiev, Ilya D. Yaroshetskii
Author Affiliations +
Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II; (1993) https://doi.org/10.1117/12.162791
Event: Physical Concepts of Materials for Novel Optoelectronic Device Applications II, 1993, Trieste, Italy
Abstract
A new type of semiconductor photosensor has been suggested and designed. Its major feature is that the size and configuration of the photosensitive region on the working surface, as well as the value of its photosensitivity to registered light, are governed by control light flux. This allows us to use the new device in optical data processing systems for various important fields, such as image signal forming, determination of light spot center position, and others. The photodetector is based on a new effect of photoinduced reversible local electric field redistribution due to the space charge of free photocarriers. On the basis of field redistribution measurements the suitable semiconductor structures were found and the first samples of the light controlled photodetector were realized. They have demonstrated rather high detectability at the control light intensity about 10-2 W/cm2, spatial resolution up to 5 lines/mm, and speed of 105 cycles/s.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrei V. Kichaev, Peter G. Kasherininov, Sergey Yu. Kuzmin, Aleksey V. Klementiev, and Ilya D. Yaroshetskii "Two-dimensional photodetector with the light-controlled area of photosensitivity", Proc. SPIE 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II, (19 November 1993); https://doi.org/10.1117/12.162791
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KEYWORDS
Photodetectors

Semiconductors

Data processing

Spatial resolution

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