Paper
28 July 1994 Optical characterization of dielectric films and modified surfaces
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Abstract
The response of an optical material to an applied stress (thermal, mechanical, chemical, electromagnetic) is influenced by certain key materials properties which include the resident microstructure, chemical and phase purity, and the magnitude of both interfacial and residual stress. Effective non-destructive methods for evaluating such materials with respect to these parameters involve the use of optical probes. Properties variations as a function of processing conditions, and during and following interaction with a high energy laser pulse can be evaluated. Results of such studies provide insight into the laser damage mechanism and suggest processing changes which might improve materials stability. A brief review of several pertinent optical characterization methods is presented and various examples are discussed which demonstrate the utility of these methods for the characterization of optical materials.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gregory J. Exarhos "Optical characterization of dielectric films and modified surfaces", Proc. SPIE 2114, Laser-Induced Damage in Optical Materials: 1993, (28 July 1994); https://doi.org/10.1117/12.180877
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KEYWORDS
Crystals

Raman spectroscopy

Optical coatings

Dielectrics

Laser induced damage

Laser irradiation

Temperature metrology

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