Paper
8 June 1994 Survivability of quantum well optoelectronic devices for space applications
Bruce D. Evans
Author Affiliations +
Abstract
Evaluation of threshold-shift damage factors versus non-ionizing energy deposition for GaAs-based, quantum-well, laser diodes and light-emitting diodes demonstrates that they obey the relation between damage factors and non-ionizing energy loss established for GaAs-based electronic devices.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruce D. Evans "Survivability of quantum well optoelectronic devices for space applications", Proc. SPIE 2215, Photonics for Space Environments II, (8 June 1994); https://doi.org/10.1117/12.177643
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Quantum wells

Gallium arsenide

Light emitting diodes

Semiconductor lasers

Optoelectronic devices

Diodes

Electrons

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