X-ray powder diffraction study of some dopant positions in unit cells of chosen AIIBVI compounds crystals

E. Michalski; Mieczyslaw Demianiuk

doi:10.1117/12.224968

16 October 1995 X-ray powder diffraction study of some dopant positions in unit cells of chosen AIIBVI compounds crystals

E. Michalski, Mieczyslaw Demianiuk

Author Affiliations +

Proceedings Volume 2373, Solid State Crystals: Materials Science and Applications; (1995) https://doi.org/10.1117/12.224968
Event: Solid State Crystals: Materials Science and Applications, 1994, Zakopane, Poland

Abstract

The characteristic changes in relative reflections intensity (without substantial change of their positions and without any additional reflexes from any new phases) on x-ray powder diffraction patterns from different doped A^IIB^VI compound crystals have been experimentally registered. On the basis of the powder diffraction data the changes in the lattice constants (increasing as well as decreasing) have been confirmed too. These changes have been tried to be connected with crystal structure under the assumption of statistical occupation of parts of positions chosen from positions possible to occupy in the lattice. The qualitative conformity of calculated relative intensity of x-ray reflections for the best matched models with obtained experimentally and also qualitative conformity of changes in lattice constants have been obtained for examined cases. Simultaneously the possibility of obtaining such conformity for other models (with dopants occupying other positions in lattice) have been excluded. It allows us to determine the position occupying by dopants and to estimate the relative contents of dopants.

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E. Michalski and Mieczyslaw Demianiuk "X-ray powder diffraction study of some dopant positions in unit cells of chosen AIIBVI compounds crystals", Proc. SPIE 2373, Solid State Crystals: Materials Science and Applications, (16 October 1995); https://doi.org/10.1117/12.224968

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