Progress toward submicron hard x-ray imaging using elliptically bent mirrors

Alastair A. MacDowell; Richard S. Celestre; Chang-Hasnain C. Chang; Keith D. Franck; Malcolm R. Howells; Scott C. Locklin; Howard A. Padmore; J. R. Patel; Reuben Sandler

doi:10.1117/12.279374

1 November 1997 Progress toward submicron hard x-ray imaging using elliptically bent mirrors

Alastair A. MacDowell, Richard S. Celestre, Chang-Hasnain C. Chang, Keith D. Franck, Malcolm R. Howells, Scott C. Locklin, Howard A. Padmore, J. R. Patel, Reuben Sandler

Author Affiliations +

Proceedings Volume 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors; (1997) https://doi.org/10.1117/12.279374
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Of the many methods used to focus x-rays, the se of mirrors with an elliptical curvature shows the most promise of providing a sub-micron white light focus. Our group has been developing he techniques of controlled bending of mirror substrates in order to produce the desired elliptical shape. We have been successful in producing surfaces with the required microradian slope error tolerances. Details of the bending techniques used, results from laboratory slope error measurements using a Long Trace Profiler and data from the measurement of focus shape using knife edge and imaging methods using x-rays in the 5 - 12 KeV energy range are presented. The development of a white light focusing opens many possibilities in diffraction and spectroscopic studies.

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Alastair A. MacDowell, Richard S. Celestre, Chang-Hasnain C. Chang, Keith D. Franck, Malcolm R. Howells, Scott C. Locklin, Howard A. Padmore, J. R. Patel, and Reuben Sandler "Progress toward submicron hard x-ray imaging using elliptically bent mirrors", Proc. SPIE 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors, (1 November 1997); https://doi.org/10.1117/12.279374

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